TREA

Edward R. Vokoun III

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  • Boerne, TX, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor wafer defect monitoring
    • Patent number 5,392,113
    • Issue date Feb 21, 1995
    • VLSI Technology, Inc.
    • Anthony Sayka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Box for an optical stepper reticle
    • Patent number 5,296,893
    • Issue date Mar 22, 1994
    • VLSI Technology, Inc.
    • Charles G. Shaw
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY