Edward Steketee

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Ft. Collins, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Sub-micron accuracy edge detector
- Patent number 6,806,484
- Issue date Oct 19, 2004
- Agilent Technologies, Inc.
- Edward Steketee
- G01 - MEASURING TESTING
Information Patent Grant
Sub-micron accuracy edge detector
- Patent number 6,765,223
- Issue date Jul 20, 2004
- Agilent Technologies, Inc.
- John Bernard Medberry
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture customization adapter enclosure
- Patent number 6,170,329
- Issue date Jan 9, 2001
- Agilent Technologies, Inc.
- Edward Steketee
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture clamping system
- Patent number 5,831,160
- Issue date Nov 3, 1998
- Hewlett-Packard Company
- Edward Steketee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sub-micron accuracy edge detector
- Publication number 20030063294
- Publication date Apr 3, 2003
- John Bernard Medberry
- G01 - MEASURING TESTING
Information Patent Application
Sub-micron accuracy edge detector
- Publication number 20030042441
- Publication date Mar 6, 2003
- Edward Steketee
- G01 - MEASURING TESTING