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Edward T. Burgess
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Carlisle, OH, US
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last 30 patents
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Patent Grant
Open grid pulsed ion chamber operating in the linear ion collection...
Patent number
4,859,854
Issue date
Aug 22, 1989
Femto-Tech, Inc.
Carl J. Kershner
G01 - MEASURING TESTING
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Patent Grant
Phase shifted feedback electrometer for pulsed ion chamber
Patent number
4,827,224
Issue date
May 2, 1989
Femto-Tech, Inc.
Carl J. Kershner
G01 - MEASURING TESTING
Information
Patent Grant
Ionization monitor with improved ultra-high megohm resistor
Patent number
4,755,682
Issue date
Jul 5, 1988
The United States of America as represented by the United States Department o...
Edward T. Burgess
G01 - MEASURING TESTING