Edward Tseng

Follow

Person

Jubei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for a charged particle beam
- Patent number 8,164,060
- Issue date Apr 24, 2012
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operation stage for wafer edge inspection and review
- Patent number 7,919,760
- Issue date Apr 5, 2011
- Hermes-Microvision, Inc.
- Jack Jau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for a charged particle beam
- Patent number 7,825,386
- Issue date Nov 2, 2010
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OPERATION STAGE FOR WAFER EDGE INSPECTION AND REVIEW
- Publication number 20100140498
- Publication date Jun 10, 2010
- HERMES-MICROVISION, INC.
- JACK JAU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR A CHARGED PARTICLE BEAM
- Publication number 20080121810
- Publication date May 29, 2008
- Hermes-Microvision, Inc.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS