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Edward Vernon Brush IV
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Colorado Springs, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
DC power rail probes and measurement methods
Patent number
11,644,488
Issue date
May 9, 2023
Keysight Technologies, Inc.
Edward Vernon Brush
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating deskew fixture
Patent number
11,428,732
Issue date
Aug 30, 2022
Keysight Technologies, Inc.
Edward Vernon Brush
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Oscilloscope probe identification
Patent number
11,287,445
Issue date
Mar 29, 2022
Keysight Technologies, Inc.
Paul Doyle
G01 - MEASURING TESTING
Information
Patent Grant
Power probe including sensor for detecting current and voltage signals
Patent number
11,119,120
Issue date
Sep 14, 2021
Keysight Technologies, Inc.
Jason Swaim
G01 - MEASURING TESTING
Information
Patent Grant
Test fixture for observing current flow through a set of resistors
Patent number
10,884,023
Issue date
Jan 5, 2021
Keysight Technologies, Inc.
Edward Vernon Brush
G01 - MEASURING TESTING
Information
Patent Grant
Test fixture for observing current flow through a set of resistors
Patent number
10,670,626
Issue date
Jun 2, 2020
Keysight Technologies, Inc.
Edward Vernon Brush
G01 - MEASURING TESTING
Information
Patent Grant
Current sensing probe incorporating a current-to-voltage conversion...
Patent number
10,359,450
Issue date
Jul 23, 2019
Keysight Technologies, Inc.
Alexander Oliva
G01 - MEASURING TESTING
Information
Patent Grant
Dual output high voltage active probe with output clamping and asso...
Patent number
9,671,427
Issue date
Jun 6, 2017
Keysight Technologies, Inc.
Kenneth W. Johnson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Oscilloscope system and method for simultaneously displaying zoomed...
Patent number
9,459,290
Issue date
Oct 4, 2016
Keysight Technologies, Inc.
Kenneth W. Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Oscilloscope probe having output clamping circuit
Patent number
9,423,422
Issue date
Aug 23, 2016
Keysight Technologies, Inc.
Edward Vernon Brush
G01 - MEASURING TESTING
Information
Patent Grant
Measurement probe providing different levels of amplification for s...
Patent number
9,316,669
Issue date
Apr 19, 2016
Keysight Technologies, Inc.
Michael T. McTigue
G01 - MEASURING TESTING
Information
Patent Grant
Oscilloscope current probe with interchangeable range and sensitivi...
Patent number
9,188,606
Issue date
Nov 17, 2015
Keysight Technologies, Inc.
Kenneth W. Johnson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OSCILLOSCOPE PROBE
Publication number
20220128601
Publication date
Apr 28, 2022
KEYSIGHT TECHNOLOGIES, INC.
Paul Doyle
G01 - MEASURING TESTING
Information
Patent Application
DC POWER RAIL PROBES AND MEASUREMENT METHODS
Publication number
20210199700
Publication date
Jul 1, 2021
Keysight Technologies, Inc.
Edward Vernon Brush
G01 - MEASURING TESTING
Information
Patent Application
SELF-CALIBRATING DESKEW FIXTURE
Publication number
20210063475
Publication date
Mar 4, 2021
KEYSIGHT TECHNOLOGIES, INC.
Edward Vernon Brush
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
POWER PROBE
Publication number
20210063440
Publication date
Mar 4, 2021
KEYSIGHT TECHNOLOGIES, INC.
Jason Swaim
G01 - MEASURING TESTING
Information
Patent Application
TEST FIXTURE FOR OBSERVING CURRENT FLOW THROUGH A SET OF RESISTORS
Publication number
20200256890
Publication date
Aug 13, 2020
KEYSIGHT TECHNOLOGIES, INC.
Edward Vernon Brush
G01 - MEASURING TESTING
Information
Patent Application
OSCILLOSCOPE PROBE
Publication number
20200132722
Publication date
Apr 30, 2020
KEYSIGHT TECHNOLOGIES, INC.
Paul Doyle
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEST FIXTURE FOR OBSERVING CURRENT FLOW THROUGH A SET OF RESISTORS
Publication number
20190187175
Publication date
Jun 20, 2019
Keysight Technologies, Inc.
Edward Vernon Brush
G01 - MEASURING TESTING
Information
Patent Application
DUAL OUTPUT HIGH VOLTAGE ACTIVE PROBE WITH OUTPUT CLAMPING AND ASSO...
Publication number
20160139178
Publication date
May 19, 2016
Keysight Technologies, Inc.
Kenneth W. Johnson
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT PROBE PROVIDING DIFFERENT LEVELS OF AMPLIFICATION FOR S...
Publication number
20150002136
Publication date
Jan 1, 2015
Keysight Technologies, Inc.
Michael T. McTigue
G01 - MEASURING TESTING
Information
Patent Application
OSCILLOSCOPE PROBE HAVING OUTPUT CLAMPING CIRCUIT
Publication number
20140320157
Publication date
Oct 30, 2014
AGILENT TECHNOLOGIES, INC.
Edward Vernon BRUSH
G01 - MEASURING TESTING
Information
Patent Application
OSCILLOSCOPE SYSTEM AND METHOD FOR SIMULTANEOUSLY DISPLAYING ZOOMED...
Publication number
20140320145
Publication date
Oct 30, 2014
AGILENT TECHNOLOGIES, INC.
Kenneth W. Johnson
G01 - MEASURING TESTING
Information
Patent Application
Oscilloscope Current Probe with Interchangeable Range and Sensitivi...
Publication number
20140320153
Publication date
Oct 30, 2014
AGILENT TECHNOLOGIES, INC.
Kenneth W. JOHNSON
G01 - MEASURING TESTING