Edward W. Ross

Person

Escondido, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Combined interferometer/ellipsometer for measuring small spacings
- Patent number 5,793,480
- Issue date Aug 11, 1998
- Phase Metrics, Inc.
- Christopher A. Lacey
- G01 - MEASURING TESTING
Information Patent Grant
Learning method and apparatus for detecting and controlling solder...
- Patent number 5,621,811
- Issue date Apr 15, 1997
- Hewlett-Packard Co.
- Paul A. Roder
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing automated circuit board solder...
- Patent number RE35423
- Issue date Jan 14, 1997
- ThermoSpectra Corporation
- John Adams
- 378 - X-ray or gamma ray systems or devices
Information Patent Grant
Method and apparatus for inspecting electrical connections
- Patent number 5,561,696
- Issue date Oct 1, 1996
- Hewlett-Packard Company
- John A. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to calibrate intensity and determine fringe or...
- Patent number 5,457,534
- Issue date Oct 10, 1995
- Phase Metrics
- Christopher Lacey
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for detecting excess/insufficient solder defects
- Patent number 5,291,535
- Issue date Mar 1, 1994
- Four PI Systems Corporation
- Bruce D. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for high resolution inspection of electronic i...
- Patent number 5,199,054
- Issue date Mar 30, 1993
- Four PI Systems Corporation
- John A. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Automated laminography system for inspection of electronics
- Patent number 5,097,492
- Issue date Mar 17, 1992
- Four PI Systems Corporation
- Bruce D. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Automated laminography system for inspection of electronics
- Patent number 5,081,656
- Issue date Jan 14, 1992
- Four PI Systems Corporation
- Bruce D. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Automated laminography system for inspection of electronics
- Patent number 4,926,452
- Issue date May 15, 1990
- Four PI Systems Corporation
- Bruce D. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing automated circuit board solder...
- Patent number 4,809,308
- Issue date Feb 28, 1989
- IRT Corporation
- John Adams
- G06 - COMPUTING CALCULATING COUNTING

Edward W. Ross

Person

Patents Grantslast 30 patents

Combined interferometer/ellipsometer for measuring small spacings

Learning method and apparatus for detecting and controlling solder...

Method and apparatus for performing automated circuit board solder...

Method and apparatus for inspecting electrical connections

Method and apparatus to calibrate intensity and determine fringe or...

Method and apparatus for detecting excess/insufficient solder defects

Method and apparatus for high resolution inspection of electronic i...

Automated laminography system for inspection of electronics

Automated laminography system for inspection of electronics

Automated laminography system for inspection of electronics

Method and apparatus for performing automated circuit board solder...