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Edward W. Wright
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Fletcher, NC, US
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last 30 patents
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Patent Grant
Mechanism for measuring device
Patent number
6,234,972
Issue date
May 22, 2001
Welch Allyn, Inc.
Raymond A. Lia
G01 - MEASURING TESTING
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Patent Grant
Mechanism for measuring device
Patent number
6,082,170
Issue date
Jul 4, 2000
Welch Allyn, Inc.
Raymond A. Lia
G01 - MEASURING TESTING
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Patent Grant
Mechanism for measuring device
Patent number
5,966,829
Issue date
Oct 19, 1999
Welch Allyn, Inc.
Raymond A. Lia
G01 - MEASURING TESTING