Edwin Flecha

Person

Boca Raton, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning force microscope with automatic surface engagement
- Patent number 6,318,159
- Issue date Nov 20, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Controlling motion of a scanning force microscope probe tip moving...
- Patent number 6,234,009
- Issue date May 22, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting fields with a single-pass, dual-amplitude-mode scanning f...
- Patent number 6,220,084
- Issue date Apr 24, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for determining side wall profiles using a sca...
- Patent number 6,169,281
- Issue date Jan 2, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting fields with a single-pass, dual-amplitude-mode scanning f...
- Patent number 6,167,753
- Issue date Jan 2, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope with automatic surface engagement and imp...
- Patent number 6,079,254
- Issue date Jun 27, 2000
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting fields with a single-pass, dual-amplitude-mode scanning f...
- Patent number 5,918,274
- Issue date Jun 29, 1999
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Controlling engagement of a scanning microscope probe with a segmen...
- Patent number 5,902,928
- Issue date May 11, 1999
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for protecting a probe tip using active lateral scanning con...
- Patent number 5,801,381
- Issue date Sep 1, 1998
- International Business Machines Corporation
- Edwin Flecha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for improving measurement accuracy using active lateral scan...
- Patent number 5,773,824
- Issue date Jun 30, 1998
- International Business Machines Corporation
- Edwin Flecha
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for opens and shorts testing of a circuit board
- Patent number 5,432,460
- Issue date Jul 11, 1995
- International Business Machines Corporation
- Edwin Flecha
- G01 - MEASURING TESTING

Edwin Flecha

Person

Patents Grantslast 30 patents

Scanning force microscope with automatic surface engagement

Controlling motion of a scanning force microscope probe tip moving...

Detecting fields with a single-pass, dual-amplitude-mode scanning f...

Apparatus and method for determining side wall profiles using a sca...

Detecting fields with a single-pass, dual-amplitude-mode scanning f...

Scanning force microscope with automatic surface engagement and imp...

Detecting fields with a single-pass, dual-amplitude-mode scanning f...

Controlling engagement of a scanning microscope probe with a segmen...

Method for protecting a probe tip using active lateral scanning con...

Method for improving measurement accuracy using active lateral scan...

Apparatus and method for opens and shorts testing of a circuit board