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Eelco VAN SETTEN
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Eindhoven, NL
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Patents Grants
last 30 patents
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Patent Grant
Method for high numerical aperture thru-slit source mask optimization
Patent number
11,815,808
Issue date
Nov 14, 2023
ASML Netherlands B.V.
Kars Zeger Troost
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Methods and patterning devices and apparatuses for measuring focus...
Patent number
11,314,174
Issue date
Apr 26, 2022
ASML Netherlands B.V.
Laurentius Cornelius De Winter
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Patterning device
Patent number
10,928,735
Issue date
Feb 23, 2021
ASML Netherlands B.V.
Marcus Adrianus Van De Kerkhof
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of characterizing, method of forming a model, method of simu...
Patent number
9,798,225
Issue date
Oct 24, 2017
ASML Netherlands B.V.
Eelco Van Setten
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
Methods and Patterning Devices and Apparatuses for Measuring Focus...
Publication number
20200264522
Publication date
Aug 20, 2020
ASML NETHERLANDS B.V.
Laurentius Cornelius DE WINTER
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
PATTERNING DEVICE
Publication number
20200096875
Publication date
Mar 26, 2020
ASML NETHERLANDS B.V.
Marcus Adrianus VAN DE KERKHOF
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD OF CHARACTERIZING, METHOD OF FORMING A MODEL, METHOD OF SIMU...
Publication number
20160266483
Publication date
Sep 15, 2016
ASML NETHERLANDS B.V.
Eelco VAN SETTEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY