Efraim Miklatzky

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Jerusalem, IL

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Patents Grantslast 30 patents

Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,804,590
- Issue date Sep 28, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,480,039
- Issue date Jan 20, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,274,444
- Issue date Sep 25, 2007
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measurement of incident power and energy
- Patent number 7,154,077
- Issue date Dec 26, 2006
- Ophir Optronics Ltd.
- Efraim Miklatzky
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for registration control during processing of...
- Patent number 6,567,713
- Issue date May 20, 2003
- Creo Il. LTD
- Yoav Lichtenstein
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for registration control during processing of...
- Patent number 6,205,364
- Issue date Mar 20, 2001
- Creo Ltd.
- Yoav Lichtenstein
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Multi mode inspection method and apparatus
- Publication number 20090091749
- Publication date Apr 9, 2009
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Multi mode inspection method and apparatus
- Publication number 20070291256
- Publication date Dec 20, 2007
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Multi mode inspection method and apparatus
- Publication number 20060007434
- Publication date Jan 12, 2006
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Device and method for measurement of incident power and energy
- Publication number 20050180487
- Publication date Aug 18, 2005
- Ophir Optronics Ltd.
- Ephraim Greenfield
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for registration control during processing of...
- Publication number 20010001840
- Publication date May 24, 2001
- Yoav Lichtenstein
- G05 - CONTROLLING REGULATING