Efraim Rotem

Follow

Person

Hod Hasharon, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Optics symmetrization for metrology
- Patent number 9,164,397
- Issue date Oct 20, 2015
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Metrology systems and methods
- Patent number 9,080,971
- Issue date Jul 14, 2015
- KLA-Tencor Corp.
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Grant
Metrology systems and methods
- Patent number 8,873,054
- Issue date Oct 28, 2014
- KLA-Tencor Corp.
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Grant
Metrology systems and methods
- Patent number 8,441,639
- Issue date May 14, 2013
- KLA-Tencor Corp.
- Daniel Kandel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Metrology Systems and Methods
- Publication number 20150036142
- Publication date Feb 5, 2015
- KLA-Tencor Corporation
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Application
Metrology Systems and Methods
- Publication number 20130229661
- Publication date Sep 5, 2013
- KLA-Tencor Corporation
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Application
OPTICS SYMMETRIZATION FOR METROLOGY
- Publication number 20120033226
- Publication date Feb 9, 2012
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEMS AND METHODS
- Publication number 20110069312
- Publication date Mar 24, 2011
- KLA-Tencor Corporation
- Daniel Kandel
- G01 - MEASURING TESTING