Efrat Rosenman

Person

Asseret, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of defect classification and system thereof
- Patent number 11,526,979
- Issue date Dec 13, 2022
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,348,001
- Issue date May 31, 2022
- APPLIED MATERIAL ISRAEL, LTD.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,205,119
- Issue date Dec 21, 2021
- Applied Materials Israel Ltd.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,010,665
- Issue date May 18, 2021
- APPLIED MATERIAL ISRAEL, LTD.
- Leonid Karlinsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of defect classification and system thereof
- Patent number 10,748,271
- Issue date Aug 18, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High throughput across-wafer-variation mapping
- Patent number 7,990,546
- Issue date Aug 2, 2011
- Applied Materials Israel, Ltd.
- Jeong Ho Yeo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20220067523
- Publication date Mar 3, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEFECT CLASSIFICATION AND SYSTEM THEREOF
- Publication number 20200372631
- Publication date Nov 26, 2020
- APPLIED MATERIALS ISRAEL, LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEFECT CLASSIFICATION AND SYSTEM THEREOF
- Publication number 20190333208
- Publication date Oct 31, 2019
- APPLIED MATERIALS ISRAEL, LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...
- Publication number 20170364798
- Publication date Dec 21, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170357895
- Publication date Dec 14, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...
- Publication number 20170177997
- Publication date Jun 22, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Leonid KARLINSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH THROUGHPUT ACROSS-WAFER-VARIATION MAPPING
- Publication number 20090021749
- Publication date Jan 22, 2009
- Jeong Ho Yeo
- G01 - MEASURING TESTING

Efrat Rosenman

Person

Patents Grantslast 30 patents

Method of defect classification and system thereof

Method of deep learning-based examination of a semiconductor specim...

Method of deep learning-based examination of a semiconductor specim...

Method of deep learning-based examination of a semiconductor specim...

Method of defect classification and system thereof

High throughput across-wafer-variation mapping

Patents Applicationslast 30 patents

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

METHOD OF DEFECT CLASSIFICATION AND SYSTEM THEREOF

METHOD OF DEFECT CLASSIFICATION AND SYSTEM THEREOF

METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

METHOD OF DEEP LEARINING-BASED EXAMINATION OF A SEMICONDUCTOR SPECI...

HIGH THROUGHPUT ACROSS-WAFER-VARIATION MAPPING