Efrat Rozenman

Person

Asseret, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting a specimen and system thereof
- Patent number 10,545,490
- Issue date Jan 28, 2020
- Applied Materials Israel Ltd.
- Michele Dalla-Torre
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integration of automatic and manual defect classification
- Patent number 10,043,264
- Issue date Aug 7, 2018
- Applied Materials Israel Ltd.
- Gadi Greenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classification using CAD-based context attributes
- Patent number 9,858,658
- Issue date Jan 2, 2018
- Applied Materials Israel Ltd.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a specimen and system thereof
- Patent number 9,851,714
- Issue date Dec 26, 2017
- Applied Materials Israel, Ltd.
- Michele Dalla-Torre
- G05 - CONTROLLING REGULATING
Information Patent Grant
System, method and computer program product for defect detection ba...
- Patent number 9,767,356
- Issue date Sep 19, 2017
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimization of unknown defect rejection for automatic defect class...
- Patent number 9,715,723
- Issue date Jul 25, 2017
- Applied Materials Israel Ltd.
- Vladimir Shlain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods and computer program products for signature detection
- Patent number 9,613,255
- Issue date Apr 4, 2017
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Classifier readiness and maintenance in automatic defect classifica...
- Patent number 9,607,233
- Issue date Mar 28, 2017
- Applied Materials Israel Ltd.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classification using topographical attributes
- Patent number 9,595,091
- Issue date Mar 14, 2017
- Applied Materials Israel, Ltd.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, system, and computer program product for detection of defec...
- Patent number 9,558,548
- Issue date Jan 31, 2017
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of design-based defect classification and system thereof
- Patent number 9,401,013
- Issue date Jul 26, 2016
- Applied Materials Israel, Ltd.
- Mark Geshel
- G01 - MEASURING TESTING
Information Patent Grant
System, a method and a computer program product for patch-based def...
- Patent number 9,235,885
- Issue date Jan 12, 2016
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G01 - MEASURING TESTING
Information Patent Grant
System, method and computer program product for defect detection ba...
- Patent number 9,070,014
- Issue date Jun 30, 2015
- Applied Materials Israel, Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, system, and computer program product for detection of defec...
- Patent number 9,070,180
- Issue date Jun 30, 2015
- Applied Materials Israel, Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for inspecting a plurality of dies
- Patent number 7,847,929
- Issue date Dec 7, 2010
- Applied Materials Israel, Ltd.
- Tuvia Dror Kutscher
- G01 - MEASURING TESTING
Information Patent Grant
System and method for process variation monitor
- Patent number 7,410,737
- Issue date Aug 12, 2008
- Applied Materials Israel, Ltd.
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for process variation monitor
- Patent number 7,054,480
- Issue date May 30, 2006
- Applied Materials Israel, Ltd.
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for process variation monitor
- Patent number 6,862,491
- Issue date Mar 1, 2005
- Applied Materials Israel, Ltd.
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
- Publication number 20160349742
- Publication date Dec 1, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Michele DALLA-TORRE
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF
- Publication number 20160350905
- Publication date Dec 1, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Michele DALLA-TORRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS, METHODS AND COMPUTER PROGRAM PRODUCTS FOR SIGNATURE DETECTION
- Publication number 20160292492
- Publication date Oct 6, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Moshe AMZALEG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DESIGN-BASED DEFECT CLASSIFICATION AND SYSTEM THEREOF
- Publication number 20150356719
- Publication date Dec 10, 2015
- APPLIED MATERIALS ISRAEL LTD.
- MARK GESHEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFEC...
- Publication number 20150287178
- Publication date Oct 8, 2015
- APPLIED MATERIALS ISRAEL LTD.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BA...
- Publication number 20150278597
- Publication date Oct 1, 2015
- APPLIED MATERIALS ISRAEL LTD.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFEC...
- Publication number 20140233838
- Publication date Aug 21, 2014
- APPLIED MATERIALS ISRAEL LTD.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BA...
- Publication number 20140233844
- Publication date Aug 21, 2014
- APPLIED MATERIALS ISRAEL LTD.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR PATCH-BASED DEF...
- Publication number 20140212021
- Publication date Jul 31, 2014
- APPLIED MATERIALS ISRAEL LTD.
- Moshe Amzaleg
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DESIGN-BASED DEFECT CLASSIFICATION AND SYSTEM THEREOF
- Publication number 20140212022
- Publication date Jul 31, 2014
- APPLIED MATERIALS ISRAEL LTD.
- MARK GESHEL
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATION OF AUTOMATIC AND MANUAL DEFECT CLASSIFICATION
- Publication number 20130279794
- Publication date Oct 24, 2013
- APPLIED MATERIALS ISRAEL LTD.
- Gadi Greenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CLASSIFICATION USING CAD-BASED CONTEXT ATTRIBUTES
- Publication number 20130279790
- Publication date Oct 24, 2013
- APPLIED MATERIALS ISRAEL LTD.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CLASSIFICATION USING TOPOGRAPHICAL ATTRIBUTES
- Publication number 20130279791
- Publication date Oct 24, 2013
- APPLIED MATERIALS ISRAEL LTD.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CLASSIFIER READINESS AND MAINTENANCE IN AUTOMATIC DEFECT CLASSIFICA...
- Publication number 20130279796
- Publication date Oct 24, 2013
- APPLIED MATERIALS ISRAEL LTD.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZATION OF UNKNOWN DEFECT REJECTION FOR AUTOMATIC DEFECT CLASS...
- Publication number 20130279795
- Publication date Oct 24, 2013
- APPLIED MATERIALS ISRAEL LTD.
- Vladimir Shlain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Die Column Registration
- Publication number 20080259326
- Publication date Oct 23, 2008
- Tuvia Dror Kutscher
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROCESS VARIATION MONITOR
- Publication number 20060182335
- Publication date Aug 17, 2006
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for process variation monitor
- Publication number 20050122510
- Publication date Jun 9, 2005
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for process variation monitor
- Publication number 20030219153
- Publication date Nov 27, 2003
- Applied Materials Israel Ltd.
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING

Efrat Rozenman

Person

Patents Grantslast 30 patents

Method of inspecting a specimen and system thereof

Integration of automatic and manual defect classification

Defect classification using CAD-based context attributes

Method of inspecting a specimen and system thereof

System, method and computer program product for defect detection ba...

Optimization of unknown defect rejection for automatic defect class...

Systems, methods and computer program products for signature detection

Classifier readiness and maintenance in automatic defect classifica...

Defect classification using topographical attributes

Method, system, and computer program product for detection of defec...

Method of design-based defect classification and system thereof

System, a method and a computer program product for patch-based def...

System, method and computer program product for defect detection ba...

Method, system, and computer program product for detection of defec...

Methods and apparatus for inspecting a plurality of dies

System and method for process variation monitor

System and method for process variation monitor

System and method for process variation monitor

Patents Applicationslast 30 patents

METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

METHOD OF INSPECTING A SPECIMEN AND SYSTEM THEREOF

SYSTEMS, METHODS AND COMPUTER PROGRAM PRODUCTS FOR SIGNATURE DETECTION

METHOD OF DESIGN-BASED DEFECT CLASSIFICATION AND SYSTEM THEREOF

METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFEC...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BA...

METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFEC...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BA...

SYSTEM, A METHOD AND A COMPUTER PROGRAM PRODUCT FOR PATCH-BASED DEF...

METHOD OF DESIGN-BASED DEFECT CLASSIFICATION AND SYSTEM THEREOF

INTEGRATION OF AUTOMATIC AND MANUAL DEFECT CLASSIFICATION

DEFECT CLASSIFICATION USING CAD-BASED CONTEXT ATTRIBUTES

DEFECT CLASSIFICATION USING TOPOGRAPHICAL ATTRIBUTES

CLASSIFIER READINESS AND MAINTENANCE IN AUTOMATIC DEFECT CLASSIFICA...

OPTIMIZATION OF UNKNOWN DEFECT REJECTION FOR AUTOMATIC DEFECT CLASS...

Die Column Registration

SYSTEM AND METHOD FOR PROCESS VARIATION MONITOR

System and method for process variation monitor

System and method for process variation monitor