Egbert Spiegel

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Marl, DE

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Patents Grantslast 30 patents

Information Patent Grant
Optimized chirp signal shaping for ultrasonic sensing systems
- Patent number 12,025,756
- Issue date Jul 2, 2024
- Elmos Semiconductor SE
- Egbert Spiegel
- G01 - MEASURING TESTING
Information Patent Grant
Ditch and obstruction detection system for motor vehicles
- Patent number 11,851,065
- Issue date Dec 26, 2023
- Elmos Semiconductor SE
- Egbert Spiegel
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and device for detecting the temperature of the vibrating el...
- Patent number 11,156,507
- Issue date Oct 26, 2021
- Elmos Semiconductor SE
- Egbert Spiegel
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Method for detecting an obstacle by means of reflected ultrasonic w...
- Patent number 11,117,518
- Issue date Sep 14, 2021
- Elmos Semiconductor SE
- Egbert Spiegel
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND A DEVICE FOR EXAMINING THE ENVIRONMENT OF A VEHICLE USIN...
- Publication number 20230324547
- Publication date Oct 12, 2023
- Elmos Semiconductor SE
- Egbert Spiegel
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZED CHIRP SIGNAL SHAPING FOR ULTRASONIC SENSING SYSTEMS
- Publication number 20210149032
- Publication date May 20, 2021
- Elmos Semiconductor SE
- Egbert Spiegel
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING AN OBSTACLE BY MEANS OF REFLECTED ULTRASONIC W...
- Publication number 20190366922
- Publication date Dec 5, 2019
- ELMOS Semiconductor AG
- Egbert Spiegel
- B60 - VEHICLES IN GENERAL
Information Patent Application
DITCH AND OBSTRUCTION DETECTION SYSTEM FOR MOTOR VEHICLES
- Publication number 20190359217
- Publication date Nov 28, 2019
- Elmos Semiconductor AG
- Egbert Spiegel
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD AND DEVICE FOR DETECTING THE TEMPERATURE OF THE VIBRATING EL...
- Publication number 20190242761
- Publication date Aug 8, 2019
- ELMOS Semiconductor AG
- Egbert Spiegel
- G01 - MEASURING TESTING