Ehrenfried Zschech

Person

Morizburg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Device for carrying out bending tests on panel-shaped or beam shape...
- Patent number 11,243,151
- Issue date Feb 8, 2022
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG B.V.
- Christoph Sander
- G01 - MEASURING TESTING
Information Patent Grant
Illumination and imaging device for high-resolution X-ray microscop...
- Patent number 10,153,062
- Issue date Dec 11, 2018
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Martin Gall
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Arrangement and method for the synchronous determination of the she...
- Patent number 10,151,645
- Issue date Dec 11, 2018
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Kong Boon Yeap
- G01 - MEASURING TESTING
Information Patent Grant
Insulation material for integrated circuits and use of said integra...
- Patent number 9,117,771
- Issue date Aug 25, 2015
- Leibniz-Institut fuer Festkoerper-und Werkstoffforschung Dresden e.V.
- Gotthart Seifert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoprobe tip for advanced scanning probe microscopy comprising a l...
- Patent number 8,056,402
- Issue date Nov 15, 2011
- Advanced Micro Devices, Inc.
- Michael Hecker
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Technique for forming embedded metal lines having increased resista...
- Patent number 8,039,395
- Issue date Oct 18, 2011
- GLOBALFOUNDRIES Inc.
- Moritz-Andreas Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining surface characteristics by usi...
- Patent number 7,441,446
- Issue date Oct 28, 2008
- Advanced Micro Devices, Inc.
- Dmytro Chumakov
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure comprising a stress sensitive element and m...
- Patent number 7,311,008
- Issue date Dec 25, 2007
- Advanced Micro Devices, Inc.
- Eckhard Langer
- G01 - MEASURING TESTING
Information Patent Grant
Metal line having an increased resistance to electromigration along...
- Patent number 7,183,629
- Issue date Feb 27, 2007
- Advanced Micro Devices, Inc.
- Hans-Juergen Engelmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for monitoring the state of metal lines in microstructures
- Patent number 6,953,755
- Issue date Oct 11, 2005
- Advanced Micro Devices, Inc.
- Moritz Andreas Meyer
- G01 - MEASURING TESTING
Information Patent Grant
Soft error resistant semiconductor device
- Patent number 6,894,390
- Issue date May 17, 2005
- Advanced Micro Devices, Inc.
- Gisela Schammler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of sample preparation for electron microscopy
- Patent number 6,303,399
- Issue date Oct 16, 2001
- Advanced Micro Devices Inc.
- Hans-Juergen Engelmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR CARRYING OUT BENDING TESTS ON PANEL-SHAPED OR BEAM SHAPE...
- Publication number 20200309652
- Publication date Oct 1, 2020
- Fraunhofer-Gesellschaft zur foerderung der Angewandten Forschung e.V.
- Christoph SANDER
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION AND IMAGING DEVICE FOR HIGH-RESOLUTION X-RAY MICROSCOP...
- Publication number 20170003234
- Publication date Jan 5, 2017
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG e.V.
- Martin GALL
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT AND METHOD FOR THE SYNCHRONOUS DETERMINATION OF THE SHE...
- Publication number 20150066394
- Publication date Mar 5, 2015
- Fraunhofer-Gesellschaft zur foerderung der Angewandten Forschung e.V.
- Kong Boon YEAP
- G01 - MEASURING TESTING
Information Patent Application
INSULATION MATERIAL FOR INTEGRATED CIRCUITS AND USE OF SAID INTEGRA...
- Publication number 20110297869
- Publication date Dec 8, 2011
- LEIBNIZ-INSTITUT FÜR FESTKÖRPER-UND WERKSTOFFORSCHUNG DRESDEN E.V.
- Gotthart Seifert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOPROBE TIP FOR ADVANCED SCANNING PROBE MICROSCOPY COMPRISING A L...
- Publication number 20090114000
- Publication date May 7, 2009
- Michael Hecker
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING SURFACE CHARACTERISTICS BY USI...
- Publication number 20070044544
- Publication date Mar 1, 2007
- Dmytro Chumakov
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor structure comprising a stress sensitive element and m...
- Publication number 20050263760
- Publication date Dec 1, 2005
- Eckhard Langer
- G01 - MEASURING TESTING
Information Patent Application
Technique for forming embedded metal lines having increased resista...
- Publication number 20050161817
- Publication date Jul 28, 2005
- Moritz-Andreas Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Technique for monitoring the state of metal lines in microstructures
- Publication number 20050072919
- Publication date Apr 7, 2005
- Moritz Andreas Meyer
- G01 - MEASURING TESTING
Information Patent Application
Metal line having an increased resistance to electromigration along...
- Publication number 20050046031
- Publication date Mar 3, 2005
- Hans-Juergen Engelmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Soft error resistant semiconductor device
- Publication number 20040164409
- Publication date Aug 26, 2004
- Gisela Schammler
- H01 - BASIC ELECTRIC ELEMENTS

Ehrenfried Zschech

Person

Patents Grantslast 30 patents

Device for carrying out bending tests on panel-shaped or beam shape...

Illumination and imaging device for high-resolution X-ray microscop...

Arrangement and method for the synchronous determination of the she...

Insulation material for integrated circuits and use of said integra...

Nanoprobe tip for advanced scanning probe microscopy comprising a l...

Technique for forming embedded metal lines having increased resista...

Method and apparatus for determining surface characteristics by usi...

Semiconductor structure comprising a stress sensitive element and m...

Metal line having an increased resistance to electromigration along...

Technique for monitoring the state of metal lines in microstructures

Soft error resistant semiconductor device

Method of sample preparation for electron microscopy

Patents Applicationslast 30 patents

DEVICE FOR CARRYING OUT BENDING TESTS ON PANEL-SHAPED OR BEAM SHAPE...

ILLUMINATION AND IMAGING DEVICE FOR HIGH-RESOLUTION X-RAY MICROSCOP...

ARRANGEMENT AND METHOD FOR THE SYNCHRONOUS DETERMINATION OF THE SHE...

INSULATION MATERIAL FOR INTEGRATED CIRCUITS AND USE OF SAID INTEGRA...

NANOPROBE TIP FOR ADVANCED SCANNING PROBE MICROSCOPY COMPRISING A L...

METHOD AND APPARATUS FOR DETERMINING SURFACE CHARACTERISTICS BY USI...

Semiconductor structure comprising a stress sensitive element and m...

Technique for forming embedded metal lines having increased resista...

Technique for monitoring the state of metal lines in microstructures

Metal line having an increased resistance to electromigration along...

Soft error resistant semiconductor device