Ehud Tirosh

Person

Mevaseret zion, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Proximity-based navigation method
- Patent number 12,078,735
- Issue date Sep 3, 2024
- VEERIDE GEO LTD.
- Ehud Tirosh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Cellular-based navigation method
- Patent number 11,812,342
- Issue date Nov 7, 2023
- VEERIDE GEO LTD.
- Zvi Lapidot
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Smartphone-assisted portable augmented reality (AR) device and clip...
- Patent number 11,347,082
- Issue date May 31, 2022
- VEERIDE LTD.
- Zvi Lapidot
- G02 - OPTICS
Information Patent Grant
Apparatus and method for augmented reality
- Patent number 10,962,778
- Issue date Mar 30, 2021
- VEERIDE LTD.
- Zvi Lapidot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High resolution printer and a method for high resolution printing
- Patent number 7,846,649
- Issue date Dec 7, 2010
- Applied Materials Israel, Ltd.
- Ehud Tirosh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Microscopic inspection apparatus for reducing image smear using a p...
- Patent number 7,844,103
- Issue date Nov 30, 2010
- Applied Materials Israel, Ltd.
- Ehud Tirosh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,842,935
- Issue date Nov 30, 2010
- Applied Materials Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection tools supporting multiple operating states for multiple...
- Patent number 7,826,049
- Issue date Nov 2, 2010
- Applied Materials South East Asia Pte. Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection apparatus for substrate defect detection
- Patent number 7,796,807
- Issue date Sep 14, 2010
- Applied Materials, Israel Ltd.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Automatic optical inspection using multiple objectives
- Patent number 7,599,075
- Issue date Oct 6, 2009
- Applied Materials, Israel, Ltd.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,521,700
- Issue date Apr 21, 2009
- Applied Materials, Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Probe card and a method for detecting defects using a probe card an...
- Patent number 7,518,391
- Issue date Apr 14, 2009
- Applied Materials, Israel, Ltd.
- Moshe Langer
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method for substrate defect detection
- Patent number 7,499,583
- Issue date Mar 3, 2009
- Applied Materials, Israel, Ltd.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for automatic optical inspection
- Patent number 7,394,531
- Issue date Jul 1, 2008
- Applied Materials, Inc.
- Ehud Tirosh
- G01 - MEASURING TESTING
Information Patent Grant
Automatic optical inspection using multiple objectives
- Patent number 7,355,689
- Issue date Apr 8, 2008
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reticle inspection using aerial imaging
- Patent number 7,133,548
- Issue date Nov 7, 2006
- Applied Materials, Inc.
- Boaz Kenan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,098,468
- Issue date Aug 29, 2006
- Applied Materials, Inc.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical inspection apparatus for substrate defect detection
- Patent number 6,952,491
- Issue date Oct 4, 2005
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Method for reticle inspection using aerial imaging
- Patent number 6,268,093
- Issue date Jul 31, 2001
- Applied Materials, Inc.
- Boaz Kenan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Substrate inspection method and apparatus
- Patent number 6,178,257
- Issue date Jan 23, 2001
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method and apparatus
- Patent number 6,175,645
- Issue date Jan 16, 2001
- Applied Materials, Inc.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method and apparatus
- Patent number 5,982,921
- Issue date Nov 9, 1999
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Grant
Two-phase optical inspection method and apparatus for defect detection
- Patent number 5,699,447
- Issue date Dec 16, 1997
- Orbot Instruments Ltd.
- David Alumot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CELLULAR-BASED NAVIGATION METHOD
- Publication number 20220295229
- Publication date Sep 15, 2022
- VEERIDE GEO LTD.
- ZVI LAPIDOT
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PROXIMITY-BASED NAVIGATION METHOD
- Publication number 20220043163
- Publication date Feb 10, 2022
- VEERIDE GEO LTD.
- EHUD TIROSH
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Smartphone-Assisted Portable Augmented Reality (AR) Device and Clip...
- Publication number 20210223575
- Publication date Jul 22, 2021
- VEERIDE LTD.
- Zvi Lapidot
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR AUGMENTED REALITY
- Publication number 20190227314
- Publication date Jul 25, 2019
- VEERIDE LTD.
- Zvi Lapidot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Microscopic inspection apparatus for reducing image smear using a p...
- Publication number 20090279776
- Publication date Nov 12, 2009
- Ehud Tirosh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Tools Supporting Multiple Operating States for Multiple...
- Publication number 20090201494
- Publication date Aug 13, 2009
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS FOR SUBSTRATE DEFECT DETECTION
- Publication number 20090148033
- Publication date Jun 11, 2009
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC OPTICAL INSPECTION USING MULTIPLE OBJECTIVES
- Publication number 20080186556
- Publication date Aug 7, 2008
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR AUTOMATIC OPTICAL INSPECTION REFERENCE TO...
- Publication number 20070159623
- Publication date Jul 12, 2007
- EHUD TIROSH
- G01 - MEASURING TESTING
Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243918
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243922
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Automatic optical inspection using multiple objectives
- Publication number 20060170910
- Publication date Aug 3, 2006
- Applied Materials Israel, Ltd.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
High resolution printer and a method for high resolution printing
- Publication number 20060055911
- Publication date Mar 16, 2006
- Applied Materials Israel Ltd.
- Ehud Tirosh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raster frame beam system for electron beam lithography
- Publication number 20050274911
- Publication date Dec 15, 2005
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Probe card and a method for detecting defects using a probe card an...
- Publication number 20050278134
- Publication date Dec 15, 2005
- Moshe Langer
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection apparatus for substrate defect detection
- Publication number 20040263834
- Publication date Dec 30, 2004
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection method for substrate defect detection
- Publication number 20040218807
- Publication date Nov 4, 2004
- Applied Materials, Inc.
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection apparatus for defect detection
- Publication number 20020039436
- Publication date Apr 4, 2002
- David Alumot
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for reticle inspection using aerial imaging
- Publication number 20010019625
- Publication date Sep 6, 2001
- Boaz Kenan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Ehud Tirosh

Person

Patents Grantslast 30 patents

Proximity-based navigation method

Cellular-based navigation method

Smartphone-assisted portable augmented reality (AR) device and clip...

Apparatus and method for augmented reality

High resolution printer and a method for high resolution printing

Microscopic inspection apparatus for reducing image smear using a p...

Raster frame beam system for electron beam lithography

Inspection tools supporting multiple operating states for multiple...

Optical inspection apparatus for substrate defect detection

Automatic optical inspection using multiple objectives

Raster frame beam system for electron beam lithography

Probe card and a method for detecting defects using a probe card an...

Optical inspection method for substrate defect detection

Apparatus and method for automatic optical inspection

Automatic optical inspection using multiple objectives

Method and apparatus for reticle inspection using aerial imaging

Raster frame beam system for electron beam lithography

Optical inspection apparatus for substrate defect detection

Method for reticle inspection using aerial imaging

Substrate inspection method and apparatus

Optical inspection method and apparatus

Optical inspection method and apparatus

Two-phase optical inspection method and apparatus for defect detection

Patents Applicationslast 30 patents

CELLULAR-BASED NAVIGATION METHOD

PROXIMITY-BASED NAVIGATION METHOD

Smartphone-Assisted Portable Augmented Reality (AR) Device and Clip...

APPARATUS AND METHOD FOR AUGMENTED REALITY

Microscopic inspection apparatus for reducing image smear using a p...

Inspection Tools Supporting Multiple Operating States for Multiple...

OPTICAL INSPECTION APPARATUS FOR SUBSTRATE DEFECT DETECTION

AUTOMATIC OPTICAL INSPECTION USING MULTIPLE OBJECTIVES

APPARATUS AND METHOD FOR AUTOMATIC OPTICAL INSPECTION REFERENCE TO...

Raster Frame Beam System For Electron Beam Lithography

Raster Frame Beam System For Electron Beam Lithography

Automatic optical inspection using multiple objectives

High resolution printer and a method for high resolution printing

Raster frame beam system for electron beam lithography

Probe card and a method for detecting defects using a probe card an...

Optical inspection apparatus for substrate defect detection

Optical inspection method for substrate defect detection

Optical inspection apparatus for defect detection

Method and apparatus for reticle inspection using aerial imaging