Eichi Osato

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Musashino-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
IC carrie, IC socket and method for testing IC device
- Patent number 7,884,630
- Issue date Feb 8, 2011
- Micronics Japan Co., Ltd.
- Eichi Osato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ic Carrier, Ic Socket and Method for Testing Ic Device
- Publication number 20080191723
- Publication date Aug 14, 2008
- Micronics Japan Co., Ltd.
- Eichi Osato
- G01 - MEASURING TESTING