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Eiichi Izumi
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Takahagi, JP
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last 30 patents
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Patent Grant
Secondary ion mass spectrometry apparatus
Patent number
5,041,725
Issue date
Aug 20, 1991
Hitachi, Ltd.
Eiichi Izumi
G01 - MEASURING TESTING
Information
Patent Grant
Secondary ion mass spectrometer
Patent number
4,851,673
Issue date
Jul 25, 1989
Hitachi, Ltd.
Eiichi Izumi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of holding an electrically insulating sample
Patent number
4,833,331
Issue date
May 23, 1989
Hitachi, Ltd.
Yoshinori Ikebe
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for generating metal ions
Patent number
4,774,433
Issue date
Sep 27, 1988
Hitachi, Ltd.
Yoshinori Ikebe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion micro-analysis
Patent number
4,510,387
Issue date
Apr 9, 1985
Hitachi, Ltd.
Eiichi Izumi
H01 - BASIC ELECTRIC ELEMENTS