Eiichi Murakami

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing measurement pipeline portion of ultrasonic...
- Patent number 11,480,454
- Issue date Oct 25, 2022
- RYUSOK CO., LTD.
- Eiichi Murakami
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Clamp-on ultrasonic flow measuring device for accurately positionin...
- Patent number 11,340,101
- Issue date May 24, 2022
- RYUSOK CO., LTD.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Clamp-type ultrasonic flow measuring apparatus with a mounter for p...
- Patent number 11,181,405
- Issue date Nov 23, 2021
- RYUSOK CO., LTD.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic flowmeter having transceivers driving and radially press...
- Patent number 10,197,424
- Issue date Feb 5, 2019
- National Institute of Advanced Industrial Science and Technology
- Harumichi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic flow meter
- Patent number 10,175,076
- Issue date Jan 8, 2019
- RYUSOK CO., LTD.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Coriolis mass flow meter
- Patent number 10,175,078
- Issue date Jan 8, 2019
- Atsuden Co., Ltd.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Coriolis mass flow meter
- Patent number 9,995,612
- Issue date Jun 12, 2018
- Atsuden Co., Ltd.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Coriolis mass flow meter
- Patent number 9,921,093
- Issue date Mar 20, 2018
- Atsuden Co., Ltd.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic type flowmeter apparatus and method of using the same
- Patent number 9,588,934
- Issue date Mar 7, 2017
- Atsuden Co., Ltd.
- Eiichi Murakami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 9,391,606
- Issue date Jul 12, 2016
- Renesas Electronics Corporation
- Noritaka Fukuo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Flow rate measuring device
- Patent number 8,997,581
- Issue date Apr 7, 2015
- National Institute of Advanced Industrial Science and Technology Atsuden Co.,...
- Harumichi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic flowmeter apparatus having a first and a second housing...
- Patent number 8,919,208
- Issue date Dec 30, 2014
- Atsuden Co., Ltd.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic flowmeter apparatus
- Patent number 8,720,280
- Issue date May 13, 2014
- Atsuden Co., Ltd.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic type flow sensor
- Patent number 8,544,344
- Issue date Oct 1, 2013
- Atsuden Co., Ltd.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a semiconductor integrated circuit device
- Patent number 8,093,723
- Issue date Jan 10, 2012
- Renesas Electronics Corporation
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor integrated circuit device
- Patent number 7,977,238
- Issue date Jul 12, 2011
- Renesas Electronics Corporation
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,786,585
- Issue date Aug 31, 2010
- Renesas Electronics Corp.
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication system and fabrication method
- Patent number 7,603,194
- Issue date Oct 13, 2009
- Renesas Technology Corp.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,411,301
- Issue date Aug 12, 2008
- Renesas Technology Corp.
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication system and fabrication method
- Patent number 7,392,106
- Issue date Jun 24, 2008
- Renesas Technology Corp.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fabrication system and fabrication method
- Patent number 7,310,563
- Issue date Dec 18, 2007
- Renesas Technology Corp.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fabrication system and fabrication method
- Patent number 7,062,344
- Issue date Jun 13, 2006
- Renesas Technology Corp.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,023,091
- Issue date Apr 4, 2006
- Renesas Technology Corp.
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing thereof
- Patent number 6,953,728
- Issue date Oct 11, 2005
- Hitachi, Ltd.
- Eiichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing thereof
- Patent number 6,727,146
- Issue date Apr 27, 2004
- Hitachi, Ltd.
- Eiichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor integrated circuit device
- Patent number 6,677,194
- Issue date Jan 13, 2004
- Hitachi, Ltd.
- Toshiaki Yamanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication system and fabrication method
- Patent number 6,099,598
- Issue date Aug 8, 2000
- Hitachi, Ltd.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fabrication system and method having inter-apparatus transporter
- Patent number 5,858,863
- Issue date Jan 12, 1999
- Hitachi, Ltd.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fabrication system and method having inter-apparatus transporter
- Patent number 5,820,679
- Issue date Oct 13, 1998
- Hitachi, Ltd.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Surface atom fabrication method and apparatus
- Patent number 5,689,494
- Issue date Nov 18, 1997
- Hitachi, Ltd.
- Masakazu Ichikawa
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ULTRASONIC FLOW AMOUNT MEASURING DEVICE
- Publication number 20200340838
- Publication date Oct 29, 2020
- RYUSOK CO., LTD.
- EIICHI MURAKAMI
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC FLOW MEASURING APPARATUS
- Publication number 20200132526
- Publication date Apr 30, 2020
- RYUSOK CO., LTD.
- EIICHI MURAKAMI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING MEASUREMENT PIPELINE PORTION OF ULTRASONIC...
- Publication number 20190353508
- Publication date Nov 21, 2019
- RYUSOK CO., LTD.
- EIICHI MURAKAMI
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
CORIOLIS MASS FLOW METER
- Publication number 20180283920
- Publication date Oct 4, 2018
- ATSUDEN CO., LTD.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC FLOW METER
- Publication number 20180283917
- Publication date Oct 4, 2018
- RYUSOK CO., LTD.
- EIICHI MURAKAMI
- G01 - MEASURING TESTING
Information Patent Application
CORIOLIS MASS FLOW METER
- Publication number 20170122787
- Publication date May 4, 2017
- ATSUDEN CO., LTD.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Application
CORIOLIS MASS FLOW METER
- Publication number 20170102257
- Publication date Apr 13, 2017
- ATSUDEN CO., LTD.
- EIICHI MURAKAMI
- G01 - MEASURING TESTING
Information Patent Application
Ultrasonic Flowmeter
- Publication number 20170059379
- Publication date Mar 2, 2017
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Harumichi SATO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Integrated Circuit Device
- Publication number 20150109046
- Publication date Apr 23, 2015
- RENESAS ELECTRONICS CORPORATION
- Noritaka Fukuo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ULTRASONIC FLOWMETER APPARATUS
- Publication number 20130180341
- Publication date Jul 18, 2013
- ATSUDEN CO., LTD.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC TYPE FLOW SENSOR
- Publication number 20130118272
- Publication date May 16, 2013
- ATSUDEN CO., LTD.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC TYPE FLOWMETER APPARATUS AND METHOD OF USING THE SAME
- Publication number 20130124131
- Publication date May 16, 2013
- ATSUDEN CO., LTD.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC FLOWMETER APPARATUS
- Publication number 20120318069
- Publication date Dec 20, 2012
- Atsuden Co., Ltd.
- Eiichi Murakami
- G01 - MEASURING TESTING
Information Patent Application
FLOW RATE MEASURING DEVICE
- Publication number 20120272747
- Publication date Nov 1, 2012
- Harumichi Sato
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20110204486
- Publication date Aug 25, 2011
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20100203724
- Publication date Aug 12, 2010
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION SYSTEM AND FABRICATION METHOD
- Publication number 20100131093
- Publication date May 27, 2010
- Renesas Technology Corp.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20080303158
- Publication date Dec 11, 2008
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication system and fabrication method
- Publication number 20080243293
- Publication date Oct 2, 2008
- RENESAS TECHNOLOGY CORP.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Fabrication system and fabrication method
- Publication number 20060111802
- Publication date May 25, 2006
- RENESAS TECHNOLOGY CORP.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Fabrication system and fabrication method
- Publication number 20060111805
- Publication date May 25, 2006
- RENESAS TECHNOLOGY CORP.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20060027928
- Publication date Feb 9, 2006
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing thereof
- Publication number 20040198002
- Publication date Oct 7, 2004
- Hitachi, Ltd.
- Eiichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication system and fabrication method
- Publication number 20040107020
- Publication date Jun 3, 2004
- Hitachi, Ltd.
- Natsuki Yokoyama
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20040065961
- Publication date Apr 8, 2004
- Takako Funakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing thereof
- Publication number 20030054613
- Publication date Mar 20, 2003
- Hitachi, Ltd.
- Eiichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semiconductor integrated circuit device
- Publication number 20020187596
- Publication date Dec 12, 2002
- Hitachi, Ltd.
- Toshiaki Yamanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing thereof
- Publication number 20020045360
- Publication date Apr 18, 2002
- Eiichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS

Eiichi Murakami

Person

Patents Grantslast 30 patents

Method for manufacturing measurement pipeline portion of ultrasonic...

Clamp-on ultrasonic flow measuring device for accurately positionin...

Clamp-type ultrasonic flow measuring apparatus with a mounter for p...

Ultrasonic flowmeter having transceivers driving and radially press...

Ultrasonic flow meter

Coriolis mass flow meter

Coriolis mass flow meter

Coriolis mass flow meter

Ultrasonic type flowmeter apparatus and method of using the same

Semiconductor integrated circuit device

Flow rate measuring device

Ultrasonic flowmeter apparatus having a first and a second housing...

Ultrasonic flowmeter apparatus

Ultrasonic type flow sensor

Method of manufacturing a semiconductor integrated circuit device

Method of manufacturing a semiconductor integrated circuit device

Semiconductor integrated circuit device

Fabrication system and fabrication method

Semiconductor integrated circuit device

Fabrication system and fabrication method

Fabrication system and fabrication method

Fabrication system and fabrication method

Semiconductor integrated circuit device

Semiconductor device and method of manufacturing thereof

Semiconductor device and method of manufacturing thereof

Method of manufacturing a semiconductor integrated circuit device

Fabrication system and fabrication method

Fabrication system and method having inter-apparatus transporter

Fabrication system and method having inter-apparatus transporter

Surface atom fabrication method and apparatus

Patents Applicationslast 30 patents

ULTRASONIC FLOW AMOUNT MEASURING DEVICE

ULTRASONIC FLOW MEASURING APPARATUS

METHOD FOR MANUFACTURING MEASUREMENT PIPELINE PORTION OF ULTRASONIC...

CORIOLIS MASS FLOW METER

ULTRASONIC FLOW METER

CORIOLIS MASS FLOW METER

CORIOLIS MASS FLOW METER

Ultrasonic Flowmeter

Semiconductor Integrated Circuit Device

ULTRASONIC FLOWMETER APPARATUS

ULTRASONIC TYPE FLOW SENSOR

ULTRASONIC TYPE FLOWMETER APPARATUS AND METHOD OF USING THE SAME

ULTRASONIC FLOWMETER APPARATUS

FLOW RATE MEASURING DEVICE

METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

FABRICATION SYSTEM AND FABRICATION METHOD

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

Fabrication system and fabrication method

Fabrication system and fabrication method

Fabrication system and fabrication method

Semiconductor integrated circuit device

Semiconductor device and method of manufacturing thereof

Fabrication system and fabrication method

Semiconductor integrated circuit device

Semiconductor device and method of manufacturing thereof

Method of manufacturing a semiconductor integrated circuit device

Semiconductor device and method of manufacturing thereof