Eiichi Murakoshi

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor package socket
- Patent number 7,871,283
- Issue date Jan 18, 2011
- Yamaichi Electronics Co., Ltd.
- Eiichi Murakoshi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cartridge for contact terminals and semiconductor device socket pro...
- Patent number 7,563,144
- Issue date Jul 21, 2009
- Yamaichi Electronics Co., Ltd.
- Shuuji Kunioka
- G01 - MEASURING TESTING
Information Patent Grant
Cartridge for contact terminals and semiconductor device socket pro...
- Patent number 7,556,507
- Issue date Jul 7, 2009
- Yamaichi Electronics Co., Ltd.
- Shuuji Kunioka
- G01 - MEASURING TESTING
Information Patent Grant
Cartridge for contact terminals and semiconductor device socket pro...
- Patent number 7,335,030
- Issue date Feb 26, 2008
- Yamaichi Electronics Co., Ltd.
- Shuuji Kunioka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR PACKAGE SOCKET
- Publication number 20100261370
- Publication date Oct 14, 2010
- Yamaichi Electronics Co., Ltd.
- Eiichi Murakoshi
- G01 - MEASURING TESTING
Information Patent Application
Cartridge for contact terminals and semiconductor device socket pro...
- Publication number 20080160797
- Publication date Jul 3, 2008
- Yamaichi Electronics Co., Ltd.
- Shuuji Kunioka
- G01 - MEASURING TESTING
Information Patent Application
Cartridge for contact terminals and semiconductor device socket pro...
- Publication number 20080113528
- Publication date May 15, 2008
- Yamaichi Electronics Co., Ltd.
- Shuuji Kunioka
- G01 - MEASURING TESTING
Information Patent Application
Cartridge for contact terminals and semiconductor device socket pro...
- Publication number 20060205247
- Publication date Sep 14, 2006
- Yamaichi Electronics Co., Ltd.
- Shuuji Kunioka
- G01 - MEASURING TESTING