Eiichi NAGAOKA

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Particle size distribution measuring device and program for particl...
- Patent number 11,879,822
- Issue date Jan 23, 2024
- Horiba, Ltd.
- Hisashi Akiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface characteristic inspection apparatus and surface characteris...
- Patent number 11,353,322
- Issue date Jun 7, 2022
- Horiba, Ltd.
- Eiichi Nagaoka
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus, system, analyzing method, and program
- Patent number 10,876,950
- Issue date Dec 29, 2020
- Horiba, Ltd.
- Yusuke Mizuno
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM, MEASUREMENT DEVICE, MEASUREMENT METHOD, AND PRO...
- Publication number 20210318173
- Publication date Oct 14, 2021
- HORIBA, Ltd.
- Eiichi NAGAOKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTICLE SIZE DISTRIBUTION MEASURING DEVICE AND PROGRAM FOR PARTICL...
- Publication number 20210208048
- Publication date Jul 8, 2021
- HORIBA, LTD.
- Hisashi AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE CHARACTERISTIC INSPECTION APPARATUS AND SURFACE CHARACTERIS...
- Publication number 20200370884
- Publication date Nov 26, 2020
- HORIBA, LTD.
- Eiichi Nagaoka
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS, SYSTEM, ANALYZING METHOD, AND PROGRAM
- Publication number 20190017916
- Publication date Jan 17, 2019
- Horiba, Ltd.
- Yusuke MIZUNO
- G06 - COMPUTING CALCULATING COUNTING