Eiichi Sekine

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Yokohoma, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device testing apparatus and its calibration method
- Patent number 6,417,682
- Issue date Jul 9, 2002
- Advantest Corporation
- Toshikazu Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing a memory
- Patent number 5,862,088
- Issue date Jan 19, 1999
- Advantest Corporation
- Hiroshi Takemoto
- G11 - INFORMATION STORAGE