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Eiichi Seya
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Stage mechanism, electron microscope having the stage mechanism and...
Patent number
7,791,043
Issue date
Sep 7, 2010
Hitachi High-Technologies Corporation
Eiichi Seya
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Scanning electron microscope
Patent number
7,514,683
Issue date
Apr 7, 2009
Hitachi High-Technologies Corporation
Kazuma Tanii
G01 - MEASURING TESTING
Information
Patent Grant
Two axis state for microscope
Patent number
6,943,945
Issue date
Sep 13, 2005
Hitachi High-Technologies Corporation
Shuichi Nakagawa
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
STAGE AND ELECTRON MICROSCOPE APPARATUS
Publication number
20090236540
Publication date
Sep 24, 2009
Hitachi High-Technologies Corporation
Eiichi Seya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning Electron Microscope
Publication number
20080217534
Publication date
Sep 11, 2008
Hitachi High-Technologies Corporation
Eiichi SEYA
G01 - MEASURING TESTING
Information
Patent Application
Stage Mechanism, Electron Microscope Having the Stage Mechanism and...
Publication number
20080211349
Publication date
Sep 4, 2008
Hitachi High-Technologies Corporation
Eiichi Seya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning electron microscope
Publication number
20070235646
Publication date
Oct 11, 2007
Kazuma Tanii
G01 - MEASURING TESTING
Information
Patent Application
Two axis stage for microscope
Publication number
20050018284
Publication date
Jan 27, 2005
Shuichi Nakagawa
G02 - OPTICS