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Eiichi SHINOHARA

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  • Nirasaki-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe device
    • Patent number 9,759,762
    • Issue date Sep 12, 2017
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe apparatus
    • Patent number 9,658,285
    • Issue date May 23, 2017
    • Tokyo Electron Limited
    • Isao Kouno
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe device having cleaning mechanism for cleaning connection cond...
    • Patent number 9,638,719
    • Issue date May 2, 2017
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe apparatus
    • Patent number 9,562,942
    • Issue date Feb 7, 2017
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe apparatus
    • Patent number 9,347,970
    • Issue date May 24, 2016
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card for power device
    • Patent number 9,322,844
    • Issue date Apr 26, 2016
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe apparatus
    • Patent number 9,261,553
    • Issue date Feb 16, 2016
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Charge eliminating apparatus and method, and program storage medium...
    • Patent number 8,085,052
    • Issue date Dec 27, 2011
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Charge eliminating apparatus and method, and program storage medium
    • Patent number 7,859,279
    • Issue date Dec 28, 2010
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Wafer attracting plate
    • Patent number D609652
    • Issue date Feb 9, 2010
    • Tokyo Electron Limited
    • Munetoshi Nagasaka
    • D13 - Equipment for production, distribution, or transformation of energy

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE DEVICE
    • Publication number 20160061882
    • Publication date Mar 3, 2016
    • TOKYO ELECTRON LIMITED
    • Eiichi SHINOHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE DEVICE
    • Publication number 20160054357
    • Publication date Feb 25, 2016
    • TOKYO ELECTRON LIMITED
    • Eiichi SHINOHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20150028907
    • Publication date Jan 29, 2015
    • TOKYO ELECTRON LIMITED
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20150015285
    • Publication date Jan 15, 2015
    • TOKYO ELECTRON LIMITED
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20140247037
    • Publication date Sep 4, 2014
    • TOKYO ELECTRON LIMITED
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD FOR POWER DEVICE
    • Publication number 20140176173
    • Publication date Jun 26, 2014
    • TOKYO ELECTRON LIMITED
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20130063171
    • Publication date Mar 14, 2013
    • TOKYO ELECTRON LIMITED
    • Isao Kouno
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHARGE ELIMINATING APPARATUS AND METHOD, AND PROGRAM STORAGE MEDIUM
    • Publication number 20100283493
    • Publication date Nov 11, 2010
    • TOKYO ELECTRON LIMITED
    • Eiichi SHINOHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHARGE ELIMINATING APPARATUS AND METHOD, AND PROGRAM STORAGE MEDIUM
    • Publication number 20080100313
    • Publication date May 1, 2008
    • TOKYO ELECTRON LIMITED
    • Eiichi SHINOHARA
    • G01 - MEASURING TESTING