Eiichi Yada

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Waveform measuring apparatus and waveform obtaining method
- Patent number 6,265,860
- Issue date Jul 24, 2001
- Advantest Corporation
- Hiroshi Eguchi
- G01 - MEASURING TESTING
Information Patent Grant
Waveform sampling apparatus
- Patent number 6,087,825
- Issue date Jul 11, 2000
- Advantest Corporation
- Hiroshi Eguchi
- G01 - MEASURING TESTING