Eiji Arima

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Patents Grantslast 30 patents

Information Patent Grant
Defect inspection device and inspection method, and optical module
- Patent number 12,025,569
- Issue date Jul 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
- Publication number 20240230551
- Publication date Jul 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
- Publication number 20240133824
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE
- Publication number 20240096667
- Publication date Mar 21, 2024
- Hitachi High-Tech Corporation
- Hiromichi YAMAKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20230175978
- Publication date Jun 8, 2023
- Hitachi High-Tech Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE
- Publication number 20230160835
- Publication date May 25, 2023
- HITACHI HIGH-TECH CORPORATION
- Eiji ARIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE AND INSPECTION METHOD, AND OPTICAL MODULE
- Publication number 20220074868
- Publication date Mar 10, 2022
- Hitachi High-Tech Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING