Eiji Hama

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Shiojiri-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample analyzer
- Patent number 8,961,876
- Issue date Feb 24, 2015
- Sysmex Corporation
- Eiji Tanoshima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE ANALYZER
- Publication number 20120129247
- Publication date May 24, 2012
- Eiji Tanoshima
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD AND COMPUTER PROGRAM PRODUCT
- Publication number 20110184536
- Publication date Jul 28, 2011
- SYSMEX CORPORATION
- Eiji Tanoshima
- G06 - COMPUTING CALCULATING COUNTING