Eiji IIDA

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and cantilever moving method
- Patent number 10,794,931
- Issue date Oct 6, 2020
- SHIMADZU CORPORATION
- Eiji Iida
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,641,790
- Issue date May 5, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and light intensity adjusting method
- Patent number 10,598,691
- Issue date Mar 24, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE ASSESSMENT METHOD AND SPM
- Publication number 20240069064
- Publication date Feb 29, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD
- Publication number 20190331711
- Publication date Oct 31, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190324053
- Publication date Oct 24, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND CANTILEVER MOVING METHOD
- Publication number 20190317124
- Publication date Oct 17, 2019
- Shimadzu Corporation
- Eiji IIDA
- G01 - MEASURING TESTING