Eiji IMAI

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 10,458,924
- Issue date Oct 29, 2019
- Hitachi High-Technologies Corporation
- Hisaaki Kanai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,525,984
- Issue date Sep 3, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 8,422,009
- Issue date Apr 16, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus
- Patent number 8,395,766
- Issue date Mar 12, 2013
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 7,999,932
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 7,986,405
- Issue date Jul 26, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection apparatus
- Patent number 7,898,653
- Issue date Mar 1, 2011
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 7,733,473
- Issue date Jun 8, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter inspection method and foreign matter inspection appa...
- Patent number 7,719,671
- Issue date May 18, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20190178813
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Hisaaki KANAI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20130194579
- Publication date Aug 1, 2013
- Yukihisa Mohara
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20120224173
- Publication date Sep 6, 2012
- Hitachi High-Technologies Corporation
- Hiroyuki YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20110285989
- Publication date Nov 24, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...
- Publication number 20110267605
- Publication date Nov 3, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION APPARATUS
- Publication number 20110109901
- Publication date May 12, 2011
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20100208251
- Publication date Aug 19, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...
- Publication number 20100195095
- Publication date Aug 5, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20080239319
- Publication date Oct 2, 2008
- Hiroyuki YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
Foreign matter inspection apparatus
- Publication number 20080151234
- Publication date Jun 26, 2008
- Hitachi High-Technologies Corporation
- Eiji Imai
- G01 - MEASURING TESTING
Information Patent Application
Foreign matter inspection method and foreign matter inspection appa...
- Publication number 20070201019
- Publication date Aug 30, 2007
- Hitachi High-Technologies Corporation
- Hiroyuki Yamashita
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Foreign matter inspection method and foreign matter inspection appa...

Foreign matter inspection apparatus

Inspection apparatus and inspection method

Foreign matter inspection method and foreign matter inspection appa...

Foreign matter inspection apparatus

Inspection apparatus and inspection method

Foreign matter inspection method and foreign matter inspection appa...

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...

FOREIGN MATTER INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

FOREIGN MATTER INSPECTION METHOD AND FOREIGN MATTER INSPECTION APPA...

INSPECTION APPARATUS AND INSPECTION METHOD

Foreign matter inspection apparatus

Foreign matter inspection method and foreign matter inspection appa...