Eiji Inuzuka

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Shizuoka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device inspection system
- Patent number 6,002,792
- Issue date Dec 14, 1999
- Hamamatsu Photonics K.K.
- Shigehisa Oguri
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection system involving superimposition of...
- Patent number 5,532,607
- Issue date Jul 2, 1996
- Hamamatsu Photonics K.K.
- Eiji Inuzuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for evaluating luminous efficiency
- Patent number 5,227,638
- Issue date Jul 13, 1993
- Hamamatsu Photonics K.K.
- Yoshihiko Mizushima
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus
- Patent number 5,136,373
- Issue date Aug 4, 1992
- Hamamatsu Photonics K.K.
- Kiyoshi Kamiya
- G02 - OPTICS
Information Patent Grant
Measuring devices for two-dimensional photon-caused or corpuscular-...
- Patent number 4,602,282
- Issue date Jul 22, 1986
- Hamamatsu Photonics Kabushiki Kaisha
- Takehiro Kurono
- G01 - MEASURING TESTING
Information Patent Grant
Trigger circuit
- Patent number 4,492,879
- Issue date Jan 8, 1985
- Hamamatsu Terebi Kabushiki Kaisha
- Yutaka Tsuchiya
- H03 - BASIC ELECTRONIC CIRCUITRY