Eiji Ishibashi

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring an inner stress state of disk substrate
- Patent number 6,665,059
- Issue date Dec 16, 2003
- Fuji Electric Co., Ltd.
- Toshiyuki Kanno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of measuring inner stress state of disk substrate
- Publication number 20010028451
- Publication date Oct 11, 2001
- Toshiyuki Kanno
- G01 - MEASURING TESTING