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Eiji Ishikawa
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Variable slit width device for spectroscope
Patent number
6,765,707
Issue date
Jul 20, 2004
Ando Electric Co., Ltd.
Eiji Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Mirror supporting structure for monochromator
Patent number
6,750,965
Issue date
Jun 15, 2004
Ando Electric Co., Ltd.
Hiroshi Ando
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Monochromator
Publication number
20030063280
Publication date
Apr 3, 2003
Hiroshi Ando
G01 - MEASURING TESTING
Information
Patent Application
Mirror supporting structure for monochromator
Publication number
20020180971
Publication date
Dec 5, 2002
Hiroshi Ando
G01 - MEASURING TESTING
Information
Patent Application
Variable slit width device for spectroscope
Publication number
20020149767
Publication date
Oct 17, 2002
Eiji Ishikawa
G01 - MEASURING TESTING