Eiji Kanoh

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Sendai-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sampling apparatus, sampling method and recording medium
- Patent number 8,374,813
- Issue date Feb 12, 2013
- Advantest Corporation
- Takayuki Akita
- G01 - MEASURING TESTING
Information Patent Grant
Sampling apparatus and sampling method
- Patent number 8,271,222
- Issue date Sep 18, 2012
- Advantest Corporation
- Eiji Kanoh
- G01 - MEASURING TESTING
Information Patent Grant
Sampling apparatus, sampling method and recording medium
- Patent number 8,229,706
- Issue date Jul 24, 2012
- Advantest Corporation
- Masayuki Kawabata
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer system and spectrum analyze method
- Patent number 8,072,206
- Issue date Dec 6, 2011
- Advantest Corporation
- Eiji Kanoh
- G01 - MEASURING TESTING
Information Patent Grant
Wideband optical amplifier and wideband variable wavelength optical...
- Patent number 6,535,331
- Issue date Mar 18, 2003
- Advantest, Corp.
- Kazunori Shiota
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SAMPLING APPARATUS AND SAMPLING METHOD
- Publication number 20090306917
- Publication date Dec 10, 2009
- Advantest Corporation
- EIJI KANOH
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM ANALYZER SYSTEM AND SPECTRUM ANALYZE METHOD
- Publication number 20090302829
- Publication date Dec 10, 2009
- Advantest Corporation
- EIJI KANOH
- G01 - MEASURING TESTING
Information Patent Application
SAMPLING APPARATUS, SAMPLING METHOD AND RECORDING MEDIUM
- Publication number 20090306919
- Publication date Dec 10, 2009
- Advantest Corporation
- TAKAYUKI AKITA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLING APPARATUS, SAMPLING METHOD AND RECORDING MEDIUM
- Publication number 20090306936
- Publication date Dec 10, 2009
- Advantest Corporation
- MASAYUKI KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM ANALYZER, SPECTRUM ANALYSIS METHOD AND RECORDING MEDIUM
- Publication number 20080231254
- Publication date Sep 25, 2008
- Advantest Corporation
- Eiji Kanoh
- G01 - MEASURING TESTING
Information Patent Application
Wideband optical amplifier and wideband variable wavelength optical...
- Publication number 20010033411
- Publication date Oct 25, 2001
- Kazunori Shiota
- H01 - BASIC ELECTRIC ELEMENTS