Eiji Kimura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical characteristics measuring apparatus, method and recording m...
- Patent number 7,130,031
- Issue date Oct 31, 2006
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristics measuring apparatus, method and recording m...
- Patent number 7,027,137
- Issue date Apr 11, 2006
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus, method and recording me...
- Patent number 6,954,263
- Issue date Oct 11, 2005
- Advantest Corporation
- Kenichi Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus, method and recording me...
- Patent number 6,864,967
- Issue date Mar 8, 2005
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus, the method thereof and...
- Patent number 6,678,041
- Issue date Jan 13, 2004
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring optical characteristics and reco...
- Patent number 6,654,104
- Issue date Nov 25, 2003
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus, the method thereof and...
- Patent number 6,519,028
- Issue date Feb 11, 2003
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring optical characteristics and reco...
- Patent number 6,433,865
- Issue date Aug 13, 2002
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Polarization state changing apparatus and polarization degree measu...
- Patent number 5,633,959
- Issue date May 27, 1997
- Advantest Corporation
- Shoji Niki
- G02 - OPTICS
Information Patent Grant
Optical FM characteristics measurement apparatus for laser diode
- Patent number 5,515,166
- Issue date May 7, 1996
- Advantest Corporation
- Hiroshi Mori
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Optical characteristics measuring apparatus, method and recording m...
- Publication number 20040179188
- Publication date Sep 16, 2004
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristics measuring apparatus, method and recording m...
- Publication number 20040179189
- Publication date Sep 16, 2004
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristic measuring apparatus, method and recording me...
- Publication number 20040105089
- Publication date Jun 3, 2004
- Kenichi Nakamura
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring optical characteristics and reco...
- Publication number 20020044273
- Publication date Apr 18, 2002
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring optical characteristics and reco...
- Publication number 20020044274
- Publication date Apr 18, 2002
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristics measuring apparatus, the method therof, and...
- Publication number 20020024655
- Publication date Feb 28, 2002
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristic measuring apparatus, the method thereof and...
- Publication number 20020003621
- Publication date Jan 10, 2002
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING
Information Patent Application
Optical characteristic measuring apparatus, method and recording me...
- Publication number 20010052974
- Publication date Dec 20, 2001
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING

Eiji Kimura

Person

Patents Grantslast 30 patents

Optical characteristics measuring apparatus, method and recording m...

Optical characteristics measuring apparatus, method and recording m...

Optical characteristic measuring apparatus, method and recording me...

Optical characteristic measuring apparatus, method and recording me...

Optical characteristic measuring apparatus, the method thereof and...

Apparatus and method for measuring optical characteristics and reco...

Optical characteristic measuring apparatus, the method thereof and...

Apparatus and method for measuring optical characteristics and reco...

Polarization state changing apparatus and polarization degree measu...

Optical FM characteristics measurement apparatus for laser diode

Patents Applicationslast 30 patents

Optical characteristics measuring apparatus, method and recording m...

Optical characteristics measuring apparatus, method and recording m...

Optical characteristic measuring apparatus, method and recording me...

Apparatus and method for measuring optical characteristics and reco...

Apparatus and method for measuring optical characteristics and reco...

Optical characteristics measuring apparatus, the method therof, and...

Optical characteristic measuring apparatus, the method thereof and...

Optical characteristic measuring apparatus, method and recording me...