TREA

Eiji Kobori

Follow

Person

  • Tokyo, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Electric connecting apparatus
    • Patent number 8,363,410
    • Issue date Jan 29, 2013
    • Yamaichi Electronics Co., Ltd.
    • Eiji Kobori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electrical connecting device
    • Patent number 7,914,295
    • Issue date Mar 29, 2011
    • Yamaichi Electronics Co., Ltd.
    • Yuji Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Socket for semiconductor device
    • Patent number 7,503,772
    • Issue date Mar 17, 2009
    • Yamaichi Electronics Co., Ltd.
    • Eiji Kobori
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device socket
    • Patent number 7,230,830
    • Issue date Jun 12, 2007
    • Yamaichi Electronics Co., Ltd.
    • Ryo Ujike
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Cover for a semiconductor carrier
    • Patent number D516528
    • Issue date Mar 7, 2006
    • Yamaichi Electronics Co., Ltd.
    • Yuji Nakamura
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Base for a semiconductor carrier
    • Patent number D516046
    • Issue date Feb 28, 2006
    • Yamaichi Electronics Co.
    • Yuji Nakamura
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Semiconductor carrier
    • Patent number D507545
    • Issue date Jul 19, 2005
    • Yamaichi Electronics Co., Ltd.
    • Yuji Nakamura
    • D13 - Equipment for production, distribution, or transformation of energy

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRIC CONNECTING APPARATUS
    • Publication number 20110058338
    • Publication date Mar 10, 2011
    • Eiji KOBORI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING DEVICE
    • Publication number 20100120265
    • Publication date May 13, 2010
    • Yuji NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Socket for semiconductor device
    • Publication number 20080026603
    • Publication date Jan 31, 2008
    • Yamaichi Electronics Co., Ltd.
    • Eiji Kobori
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor device socket
    • Publication number 20050231919
    • Publication date Oct 20, 2005
    • Yamaichi Electronics Co., Ltd.
    • Ryo Ujike
    • G01 - MEASURING TESTING