Eiji Nishihara

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface region identification by image area segmentation
- Patent number 7,480,407
- Issue date Jan 20, 2009
- Dainippon Screen Mfg. Co., Ltd.
- Atsushi Imamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, method, and program for assisting in selection of patter...
- Patent number 7,463,763
- Issue date Dec 9, 2008
- Dainippon Screen Mfg. Co., Ltd.
- Hiroshi Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring spectral reflectance and apparat...
- Patent number 7,206,074
- Issue date Apr 17, 2007
- Dainippon Screen Mfg. Co., Ltd.
- Hiroki Fujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Detection of an end point of polishing a substrate
- Patent number 7,003,148
- Issue date Feb 21, 2006
- Dainippon Screen Mfg. Co., Ltd.
- Junichi Shiomi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Surface region identification by image area segmentation
- Publication number 20060018540
- Publication date Jan 26, 2006
- Dainippon Screen Mfg. Co., Ltd.
- Atsushi Imamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus, method, and program for assisting in selection of patter...
- Publication number 20050259874
- Publication date Nov 24, 2005
- Dainippon Screen Mfg. Co., Ltd.
- Hiroshi Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for detecting hole area
- Publication number 20050254700
- Publication date Nov 17, 2005
- Dainippon Screen Mfg. Co., Ltd.
- Yasushi Nagata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for detecting defect and apparatus and method...
- Publication number 20050254699
- Publication date Nov 17, 2005
- Dainippon Screen Mfg, Co., Ltd.
- Hiroshi Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for measuring spectral reflectance and apparat...
- Publication number 20050206907
- Publication date Sep 22, 2005
- Dainippon Screen Mfg, Co., Ltd.
- Hiroki Fujimoto
- G01 - MEASURING TESTING
Information Patent Application
Detection of an end point of polishing a substrate
- Publication number 20020159626
- Publication date Oct 31, 2002
- Dainippon Screen Mfg. Co., Ltd.
- Junichi Shiomi
- G06 - COMPUTING CALCULATING COUNTING

Eiji Nishihara

Person

Patents Grantslast 30 patents

Surface region identification by image area segmentation

Apparatus, method, and program for assisting in selection of patter...

Apparatus and method for measuring spectral reflectance and apparat...

Detection of an end point of polishing a substrate

Patents Applicationslast 30 patents

Surface region identification by image area segmentation

Apparatus, method, and program for assisting in selection of patter...

Apparatus and method for detecting hole area

Apparatus and method for detecting defect and apparatus and method...

Apparatus and method for measuring spectral reflectance and apparat...

Detection of an end point of polishing a substrate