Eiji Takane

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Alignment method and alignment apparatus with a statistic calculati...
- Patent number 5,525,808
- Issue date Jun 11, 1996
- Nikon Corporaton
- Nobuyuki Irie
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measuring a leveling plane
- Patent number 5,475,490
- Issue date Dec 12, 1995
- Nikon Corporation
- Shigeru Hirukawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measuring the best focus position having a plurality of m...
- Patent number 5,408,083
- Issue date Apr 18, 1995
- Nikon Corporation
- Shigeru Hirukawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Aerial image measurement method and unit, optical properties measur...
- Publication number 20020041377
- Publication date Apr 11, 2002
- Nikon Corporation
- Tsuneyuki Hagiwara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY