Eiji TAKAYA

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Mito, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device
- Patent number 10,768,186
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Eiji Takaya
- G01 - MEASURING TESTING
Information Patent Grant
Sample dispensing device and nozzle tip for sample dispensing device
- Patent number 10,451,643
- Issue date Oct 22, 2019
- Hitachi High-Technologies Corporation
- Kouichi Obari
- G01 - MEASURING TESTING
Information Patent Grant
Sample dispensing apparatus and method
- Patent number 8,221,702
- Issue date Jul 17, 2012
- Hitachi High-Technologies Corporation
- Akihiro Shimoda
- G01 - MEASURING TESTING
Information Patent Grant
Sample dispensing apparatus
- Patent number 7,823,469
- Issue date Nov 2, 2010
- Hitachi High-Technologies Corporation
- Eiji Takaya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection Device
- Publication number 20180052183
- Publication date Feb 22, 2018
- Hitachi High-Technologies Corporation
- Eiji TAKAYA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DISPENSING DEVICE AND NOZZLE TIP FOR SAMPLE DISPENSING DEVICE
- Publication number 20170059600
- Publication date Mar 2, 2017
- Hitachi High-Technologies Corporation
- Kouichi OBARI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DISPENSING APPARATUS AND METHOD
- Publication number 20080317639
- Publication date Dec 25, 2008
- Akihiro SHIMODA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE DISPENSING APPARATUS
- Publication number 20080156118
- Publication date Jul 3, 2008
- Eiji TAKAYA
- G01 - MEASURING TESTING