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Eiji Takeda
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Atsugi-shi, JP
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last 30 patents
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Patent Grant
Measurement parameter input control device and measurement paramete...
Patent number
8,442,662
Issue date
May 14, 2013
Anritsu Corporation
Yohei Niki
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
MEASUREMENT PARAMETER INPUT CONTROL DEVICE AND MEASUREMENT PARAMETE...
Publication number
20110196515
Publication date
Aug 11, 2011
Anritsu Corporation
Yohei Niki
G01 - MEASURING TESTING
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Patent Application
WINDOW DISPLAY CONTROL APPARATUS AND METHOD OF CONTROLLING WINDOW D...
Publication number
20110119622
Publication date
May 19, 2011
Anritsu Corporation
Yohei Niki
G06 - COMPUTING CALCULATING COUNTING