Eiji TANIGUCHI

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Article inspection apparatus using spectrum analyzer
- Patent number 11,860,110
- Issue date Jan 2, 2024
- Anritsu Corporation
- Shigeo Arai
- G01 - MEASURING TESTING
Information Patent Grant
Metal detection apparatus
- Patent number 11,762,118
- Issue date Sep 19, 2023
- Anritsu Corporation
- Eiji Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Metal detection apparatus
- Patent number 10,996,363
- Issue date May 4, 2021
- ANRITSU INFIVIS CO., LTD.
- Yuki Hayakawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20230035626
- Publication date Feb 2, 2023
- Anritsu Corporation
- Shigeo ARAI
- G01 - MEASURING TESTING
Information Patent Application
METAL DETECTION APPARATUS
- Publication number 20220268960
- Publication date Aug 25, 2022
- Anritsu Corporation
- Eiji TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METAL DETECTION APPARATUS
- Publication number 20200073007
- Publication date Mar 5, 2020
- ANRITSU INFIVIS CO., LTD.
- Yuki HAYAKAWA
- G01 - MEASURING TESTING