Eiko Nakazawa

Person

Mito, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of preparing biological tissue sample and method of observin...
- Patent number 11,221,280
- Issue date Jan 11, 2022
- HITACHI HIGH-TECH CORPORATION
- Akira Sawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Specimen observation method
- Patent number 10,852,253
- Issue date Dec 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Kiyotaka Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle device and wiring method
- Patent number 10,808,312
- Issue date Oct 20, 2020
- HITACHI HIGH-TECH CORPORATION
- Yoichiro Hashimoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle device and wiring method
- Patent number 9,963,776
- Issue date May 8, 2018
- Hitachi High-Technologies Corporation
- Yoichiro Hashimoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Observation specimen for use in electron microscopy, electron micro...
- Patent number 9,202,668
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope, and method of observing specimen
- Patent number 9,129,772
- Issue date Sep 8, 2015
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for observing sample and electronic microscope
- Patent number 9,013,572
- Issue date Apr 21, 2015
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope, and method of observing specimen
- Patent number 8,785,883
- Issue date Jul 22, 2014
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample observation method
- Patent number 8,546,770
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Akinari Morikawa
- G01 - MEASURING TESTING
Information Patent Grant
Specimen observation method
- Patent number 8,410,440
- Issue date Apr 2, 2013
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 8,288,725
- Issue date Oct 16, 2012
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 8,212,224
- Issue date Jul 3, 2012
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen observation method
- Patent number 8,164,058
- Issue date Apr 24, 2012
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 7,838,829
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample observation method and transmission electron microscope
- Patent number 7,705,305
- Issue date Apr 27, 2010
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen observation method
- Patent number 7,573,030
- Issue date Aug 11, 2009
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample observation method and transmission electron microscope
- Patent number 7,214,938
- Issue date May 8, 2007
- Hitachi Science Systems, Ltd.
- Eiko Nakazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope
- Patent number 7,041,977
- Issue date May 9, 2006
- Hitachi, Ltd.
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample observation method and transmission electron microscope
- Patent number 6,982,420
- Issue date Jan 3, 2006
- Hitachi Science Systems Ltd.
- Eiko Nakazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope and means to set observation conditions
- Patent number 6,875,983
- Issue date Apr 5, 2005
- Hitachi, Ltd.
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Microscope Slide and Method for Selecting the Same
- Publication number 20240077712
- Publication date Mar 7, 2024
- Hitachi High-Tech Corporation
- Toru FUJIMURA
- G01 - MEASURING TESTING
Information Patent Application
Method of Preparing Biological Tissue Sample and Method of Observin...
- Publication number 20200232891
- Publication date Jul 23, 2020
- Akira SAWAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN OBSERVATION METHOD
- Publication number 20190051489
- Publication date Feb 14, 2019
- Hitachi High-Technologies Corporation
- Kiyotaka Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DEVICE AND WIRING METHOD
- Publication number 20180216223
- Publication date Aug 2, 2018
- Hitachi High-Technologies Corporation
- Yoichiro Hashimoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CHARGED PARTICLE DEVICE AND WIRING METHOD
- Publication number 20150299842
- Publication date Oct 22, 2015
- Hitachi High-Technologies Corporation
- Yoichiro Hashimoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE
- Publication number 20150185455
- Publication date Jul 2, 2015
- Hitachi High-Technologies Corporation
- Akiko FUJISAWA
- G02 - OPTICS
Information Patent Application
OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...
- Publication number 20140264018
- Publication date Sep 18, 2014
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
Transmission Electron Microscope, and Method of Observing Specimen
- Publication number 20140264017
- Publication date Sep 18, 2014
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20120292507
- Publication date Nov 22, 2012
- Hitachi High-Technologies Corporation
- Akinari Morikawa
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN OBSERVATION METHOD
- Publication number 20120138795
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE
- Publication number 20110205353
- Publication date Aug 25, 2011
- Akiko Fujisawa
- G02 - OPTICS
Information Patent Application
Charged Particle Beam Device
- Publication number 20110062327
- Publication date Mar 17, 2011
- Hitachi High-Technologies Corporation
- Akiko FUJISAWA
- G01 - MEASURING TESTING
Information Patent Application
Transmission Electron Microscope, and Method of Observing Specimen
- Publication number 20110057100
- Publication date Mar 10, 2011
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN OBSERVATION METHOD
- Publication number 20090274359
- Publication date Nov 5, 2009
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20090218507
- Publication date Sep 3, 2009
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Observation Method and Transmission Electron Microscope
- Publication number 20080283750
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Eiko NAKAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20080224037
- Publication date Sep 18, 2008
- Hitachi High-Technologies Corporation
- Akiko FUJISAWA
- G01 - MEASURING TESTING
Information Patent Application
Specimen observation method
- Publication number 20080073527
- Publication date Mar 27, 2008
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Application
Sample observation method and transmission electron microscope
- Publication number 20060011838
- Publication date Jan 19, 2006
- Eiko Nakazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron microscope
- Publication number 20050145792
- Publication date Jul 7, 2005
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample observation method and transmission electron microscope
- Publication number 20040114788
- Publication date Jun 17, 2004
- Eiko Nakazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron microscope
- Publication number 20020175282
- Publication date Nov 28, 2002
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS

Eiko Nakazawa

Person

Patents Grantslast 30 patents

Method of preparing biological tissue sample and method of observin...

Specimen observation method

Charged particle device and wiring method

Charged particle device and wiring method

Observation specimen for use in electron microscopy, electron micro...

Transmission electron microscope, and method of observing specimen

Method for observing sample and electronic microscope

Transmission electron microscope, and method of observing specimen

Charged particle beam device and sample observation method

Specimen observation method

Charged particle beam device

Charged particle beam device

Specimen observation method

Charged particle beam device

Sample observation method and transmission electron microscope

Specimen observation method

Sample observation method and transmission electron microscope

Electron microscope

Sample observation method and transmission electron microscope

Electron microscope and means to set observation conditions

Patents Applicationslast 30 patents

Microscope Slide and Method for Selecting the Same

Method of Preparing Biological Tissue Sample and Method of Observin...

SPECIMEN OBSERVATION METHOD

CHARGED PARTICLE DEVICE AND WIRING METHOD

CHARGED PARTICLE DEVICE AND WIRING METHOD

METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE

OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...

Transmission Electron Microscope, and Method of Observing Specimen

Charged Particle Beam Device and Sample Observation Method

SPECIMEN OBSERVATION METHOD

METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE

Charged Particle Beam Device

Transmission Electron Microscope, and Method of Observing Specimen

SPECIMEN OBSERVATION METHOD

CHARGED PARTICLE BEAM DEVICE

Sample Observation Method and Transmission Electron Microscope

Charged Particle Beam Device

Specimen observation method

Sample observation method and transmission electron microscope

Electron microscope

Sample observation method and transmission electron microscope

Electron microscope