Einat Peled

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Haifa, IL

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Patents Grantslast 30 patents

Information Patent Grant
Quick adjustment of metrology measurement parameters according to p...
- Patent number 10,699,969
- Issue date Jun 30, 2020
- KLA-Tencor Corporation
- Einat Peled
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Target location in semiconductor manufacturing
- Patent number 10,504,802
- Issue date Dec 10, 2019
- KLA-Tencor Corporation
- Naomi Ittah
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Quick Adjustment Of Metrology Measurement Parameters According To P...
- Publication number 20190074227
- Publication date Mar 7, 2019
- Einat Peled
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Target Location in Semiconductor Manufacturing
- Publication number 20180301385
- Publication date Oct 18, 2018
- KLA-Tencor Corporation
- Naomi Ittah
- H01 - BASIC ELECTRIC ELEMENTS