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Eisaku TERASHITA
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Kyoto-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Analysis system, analysis apparatus, server, and information proces...
Patent number
11,536,673
Issue date
Dec 27, 2022
Shimadzu Corporation
Eisaku Terashita
G01 - MEASURING TESTING
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Patent Grant
X-ray fluorescence analysis method and X-ray fluorescence analysis...
Patent number
9,945,796
Issue date
Apr 17, 2018
Shimadzu Corporation
Eisaku Terashita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Analysis System, Analysis Apparatus, Server, and Information Proces...
Publication number
20200174983
Publication date
Jun 4, 2020
Shimadzu Corporation
Eisaku TERASHITA
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
X-RAY FLUORESCENCE ANALYSIS METHOD AND X-RAY FLUORESCENCE ANALYSIS...
Publication number
20160258887
Publication date
Sep 8, 2016
SHIMADZU CORPORATION
Eisaku TERASHITA
G01 - MEASURING TESTING