Eisuke SHIINA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection probe
- Patent number 10,365,151
- Issue date Jul 30, 2019
- IHI Corporation
- Toshiaki Hamano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION PROBE
- Publication number 20170219422
- Publication date Aug 3, 2017
- IHI Corporation
- Toshiaki HAMANO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20160231284
- Publication date Aug 11, 2016
- IHI Corporation
- Eisuke SHIINA
- G01 - MEASURING TESTING