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Eizo Kawato
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Souraku-gun, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Input protection circuit for high-speed analogue signal and time-of...
Patent number
10,083,826
Issue date
Sep 25, 2018
SHIMADZU CORPORATION
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-frequency power supply apparatus for supplying high-frequency...
Patent number
9,537,422
Issue date
Jan 3, 2017
Shimadzu Corporation
Eizo Kawato
G05 - CONTROLLING REGULATING
Information
Patent Grant
Emission spectrophotometer
Patent number
8,643,838
Issue date
Feb 4, 2014
Shimadzu Corporation
Toshiya Habu
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-flight measuring device
Patent number
8,004,432
Issue date
Aug 23, 2011
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical emission analysis apparatus
Patent number
7,778,007
Issue date
Aug 17, 2010
Shimadzu Corporation
Eizo Kawato
G01 - MEASURING TESTING
Information
Patent Grant
Optical emission spectrometry device
Patent number
7,643,267
Issue date
Jan 5, 2010
Shimadzu Corporation
Eizo Kawato
G01 - MEASURING TESTING
Information
Patent Grant
Ion storage device
Patent number
7,501,622
Issue date
Mar 10, 2009
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of selecting ions in an ion storage device
Patent number
7,282,708
Issue date
Oct 16, 2007
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass analyzer and mass analyzing method
Patent number
7,256,397
Issue date
Aug 14, 2007
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer with an ion trap
Patent number
7,250,600
Issue date
Jul 31, 2007
Shimadzu Corporation
Shinichi Yamaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap device and its adjusting method
Patent number
7,176,456
Issue date
Feb 13, 2007
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap device
Patent number
6,977,374
Issue date
Dec 20, 2005
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectroscope and method for analysis
Patent number
6,960,762
Issue date
Nov 1, 2005
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap device and its tuning method
Patent number
6,870,159
Issue date
Mar 22, 2005
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight mass spectrometer
Patent number
6,803,564
Issue date
Oct 12, 2004
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap device
Patent number
6,730,903
Issue date
May 4, 2004
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of selecting ions in an ion storage device
Patent number
6,649,911
Issue date
Nov 18, 2003
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trapping device
Patent number
6,621,078
Issue date
Sep 16, 2003
Shimadzu Corporation
Junichi Taniguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap
Patent number
6,087,658
Issue date
Jul 11, 2000
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
HIGH-FREQUENCY POWER SUPPLY
Publication number
20130265810
Publication date
Oct 10, 2013
Shimadzu Corporation
Eizo Kawato
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
EMISSION SPECTROPHOTOMETER
Publication number
20110235033
Publication date
Sep 29, 2011
Shimadzu Corporation
TOSHIYA HABU
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT MEASURING DEVICE
Publication number
20100309031
Publication date
Dec 9, 2010
SHIMADZU CORPORATION
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INPUT PROTECTION CIRCUIT FOR HIGH-SPEED ANALOGUE SIGNAL AND TIME-OF...
Publication number
20100084551
Publication date
Apr 8, 2010
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL EMISSION SPECTROMETRY DEVICE
Publication number
20080224626
Publication date
Sep 18, 2008
Shimadzu Corporation
EIZO KAWATO
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL EMISSION ANALYSIS APPARATUS
Publication number
20070247621
Publication date
Oct 25, 2007
Shimadzu Corporation
EIZO KAWATO
G01 - MEASURING TESTING
Information
Patent Application
Time-of-flight analyzer
Publication number
20060016977
Publication date
Jan 26, 2006
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion trap device and its adjusting method
Publication number
20050263698
Publication date
Dec 1, 2005
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of selecting ions in an ion storage device
Publication number
20050236578
Publication date
Oct 27, 2005
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion trap device
Publication number
20050133711
Publication date
Jun 23, 2005
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion storage device
Publication number
20050127291
Publication date
Jun 16, 2005
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometer with an ion trap
Publication number
20050045816
Publication date
Mar 3, 2005
Shimadzu Corporation
Shinichi Yamaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion trap device and its tuning method
Publication number
20040155183
Publication date
Aug 12, 2004
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass analyzer and mass analyzing method
Publication number
20040132083
Publication date
Jul 8, 2004
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectroscope and method for analysis
Publication number
20040089799
Publication date
May 13, 2004
SHIMADZU CORPORATION
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Time-of-flight mass spectrometer
Publication number
20030102429
Publication date
Jun 5, 2003
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of selecting ions in an ion storage device
Publication number
20030071211
Publication date
Apr 17, 2003
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion trap device
Publication number
20030071210
Publication date
Apr 17, 2003
Shimadzu Corporation
Eizo Kawato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion trapping device
Publication number
20020190206
Publication date
Dec 19, 2002
Shimadzu Corporation
Junichi Taniguchi
H01 - BASIC ELECTRIC ELEMENTS