Ekaterina Mikhailovna VIATKINA

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method to characterize post-processing data in terms of individual...
- Patent number 11,709,432
- Issue date Jul 25, 2023
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of controlling a patterning process, lithographic apparatus,...
- Patent number 11,048,174
- Issue date Jun 29, 2021
- ASML Netherlands B.V.
- Michael Kubis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CONTROLLING A SEMICONDUCTOR MANUFACTURING PROCESS
- Publication number 20220236647
- Publication date Jul 28, 2022
- ASML NETHERLANDS B.V.
- Marc HAUPTMANN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD TO CHARACTERIZE POST-PROCESSING DATA IN TERMS OF INDIVIDUAL...
- Publication number 20210389683
- Publication date Dec 16, 2021
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF CONTROLLING A PATTERNING PROCESS, LITHOGRAPHIC APPARATUS,...
- Publication number 20200233311
- Publication date Jul 23, 2020
- Michael KUBIS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY