Ekkehard Pruefer

Follow

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Drain/source extension structure of a field effect transistor with...
- Patent number 8,697,530
- Issue date Apr 15, 2014
- GLOBALFOUNDRIES Inc.
- Ekkehard Pruefer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing silicide defects by removing contaminants prior...
- Patent number 7,528,026
- Issue date May 5, 2009
- Advanced Micro Devices, Inc.
- Markus Lenski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trench isolation structure for a semiconductor device with reduced...
- Patent number 7,358,150
- Issue date Apr 15, 2008
- Advanced Micro Devices, Inc.
- Klaus Hempel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DRAIN/SOURCE EXTENSION STRUCTURE OF A FIELD EFFECT TRANSISTOR WITH...
- Publication number 20080001191
- Publication date Jan 3, 2008
- Ekkehard Pruefer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REDUCING SILICIDE DEFECTS BY REMOVING CONTAMINANTS PRIOR...
- Publication number 20070254437
- Publication date Nov 1, 2007
- Markus Lenski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRENCH ISOLATION STRUCTURE FOR A SEMICONDUCTOR DEVICE WITH REDUCED...
- Publication number 20070155120
- Publication date Jul 5, 2007
- Klaus Hempel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device including semiconductor regions having differe...
- Publication number 20060094193
- Publication date May 4, 2006
- Manfred Horstmann
- H01 - BASIC ELECTRIC ELEMENTS