Elad COHEN

Person

Beer Sheva, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Detection of defects using a computationally efficient segmentation...
- Patent number 12,272,042
- Issue date Apr 8, 2025
- Applied Materials Israel Ltd.
- Elad Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects in a semiconductor specimen
- Patent number 11,386,539
- Issue date Jul 12, 2022
- Applied Materials Israel Ltd.
- Elad Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting targeted locations in a semiconductor specimen
- Patent number 11,107,207
- Issue date Aug 31, 2021
- Applied Materials Israel Ltd.
- Elad Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of examination of a specimen and system thereof
- Patent number 10,957,034
- Issue date Mar 23, 2021
- Applied Materials Israel Ltd.
- Elad Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of defect detection on a specimen and system thereof
- Patent number 10,853,932
- Issue date Dec 1, 2020
- APPLIED MATERIAL ISRAEL, LTD.
- Elad Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of defect detection and system thereof
- Patent number 10,460,434
- Issue date Oct 29, 2019
- Applied Materials Israel Ltd.
- Limor Martin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of generating an examination recipe and system thereof
- Patent number 10,290,087
- Issue date May 14, 2019
- Applied Materials Israel Ltd.
- Ariel Shkalim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF DEFECTS USING A COMPUTATIONALLY EFFICIENT SEGMENTATION...
- Publication number 20230206417
- Publication date Jun 29, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Elad COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING TARGETED LOCATIONS IN A SEMICONDUCTOR SPECIMEN
- Publication number 20210042905
- Publication date Feb 11, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Elad COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING DEFECTS IN A SEMICONDUCTOR SPECIMEN
- Publication number 20200380662
- Publication date Dec 3, 2020
- Elad COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINATION OF A SPECIMEN AND SYSTEM THEREOF
- Publication number 20200234417
- Publication date Jul 23, 2020
- Elad COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEFECT DETECTION ON A SPECIMEN AND SYSTEM THEREOF
- Publication number 20200226744
- Publication date Jul 16, 2020
- Elad COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF GENERATING AN EXAMINATION RECIPE AND SYSTEM THEREOF
- Publication number 20190080447
- Publication date Mar 14, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEFECT DETECTION AND SYSTEM THEREOF
- Publication number 20190066291
- Publication date Feb 28, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Limor MARTIN
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Detection of defects using a computationally efficient segmentation...

Detecting defects in a semiconductor specimen

Detecting targeted locations in a semiconductor specimen

Method of examination of a specimen and system thereof

Method of defect detection on a specimen and system thereof

Method of defect detection and system thereof

Method of generating an examination recipe and system thereof

Patents Applicationslast 30 patents

DETECTION OF DEFECTS USING A COMPUTATIONALLY EFFICIENT SEGMENTATION...

DETECTING TARGETED LOCATIONS IN A SEMICONDUCTOR SPECIMEN

DETECTING DEFECTS IN A SEMICONDUCTOR SPECIMEN

METHOD OF EXAMINATION OF A SPECIMEN AND SYSTEM THEREOF

METHOD OF DEFECT DETECTION ON A SPECIMEN AND SYSTEM THEREOF

METHOD OF GENERATING AN EXAMINATION RECIPE AND SYSTEM THEREOF

METHOD OF DEFECT DETECTION AND SYSTEM THEREOF