Elad Dotan

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Talmei Yehiel, IL

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Patents Grantslast 30 patents

Information Patent Grant
Integrated measurement system
- Patent number 11,994,374
- Issue date May 28, 2024
- Nova Ltd.
- Elad Dotan
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and method for measuring parameters of patterned str...
- Patent number 11,512,943
- Issue date Nov 29, 2022
- Nova Ltd.
- Danny Grossman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical method and system for defects detection in three-dimensiona...
- Patent number 10,018,574
- Issue date Jul 10, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical method and system for detecting defects in three-dimensiona...
- Patent number 9,651,498
- Issue date May 16, 2017
- Nova Measuring Instruments Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED MEASUREMENT SYSTEM
- Publication number 20210396511
- Publication date Dec 23, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Elad DOTAN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR MEASURING PARAMETERS OF PATTERNED STR...
- Publication number 20190339068
- Publication date Nov 7, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- DANNY GROSSMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METHOD AND SYSTEM FOR DEFECTS DETECTION IN THREE-DIMENSIONA...
- Publication number 20170138868
- Publication date May 18, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METHOD AND SYSTEM FOR DETECTING DEFECTS IN THREE-DIMENSIONA...
- Publication number 20150192527
- Publication date Jul 9, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- G01 - MEASURING TESTING