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Elad Schleifer
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Rehovot, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Accurate Raman spectroscopy
Patent number
12,163,892
Issue date
Dec 10, 2024
Nova Ltd.
Elad Schleifer
G01 - MEASURING TESTING
Information
Patent Grant
Accurate Raman spectroscopy
Patent number
12,152,993
Issue date
Nov 26, 2024
Nova Ltd.
Eyal Hollander
G01 - MEASURING TESTING
Information
Patent Grant
Accurate raman spectroscopy
Patent number
11,860,104
Issue date
Jan 2, 2024
Nova Ltd.
Eyal Hollander
G01 - MEASURING TESTING
Information
Patent Grant
Accurate Raman spectroscopy
Patent number
11,740,183
Issue date
Aug 29, 2023
Nova Ltd.
Elad Schleifer
G01 - MEASURING TESTING
Information
Patent Grant
Accurate Raman spectroscopy
Patent number
11,415,519
Issue date
Aug 16, 2022
Nova Ltd.
Eyal Hollander
G01 - MEASURING TESTING
Information
Patent Grant
Time-domain optical metrology and inspection of semiconductor devices
Patent number
11,366,398
Issue date
Jun 21, 2022
Nova Ltd.
Gilad Barak
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20240210322
Publication date
Jun 27, 2024
NOVA LTD
Eyal Hollander
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20240085333
Publication date
Mar 14, 2024
NOVA LTD
Elad Schleifer
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20240019375
Publication date
Jan 18, 2024
NOVA LTD
Eyal Hollander
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20230168200
Publication date
Jun 1, 2023
NOVA LTD
Eyal Hollander
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20230044886
Publication date
Feb 9, 2023
NOVA MEASURING INSTRUMENTS LTD.
Elad Schleifer
G01 - MEASURING TESTING
Information
Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
Publication number
20220390858
Publication date
Dec 8, 2022
NOVA LTD
GILAD BARAK
G01 - MEASURING TESTING
Information
Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
Publication number
20210247699
Publication date
Aug 12, 2021
NOVA MEASURING INSTRUMENTS LTD.
GILAD BARAK
G01 - MEASURING TESTING
Information
Patent Application
ACCURATE RAMAN SPECTROSCOPY
Publication number
20210223179
Publication date
Jul 22, 2021
NOVA MEASURING INSTRUMENTS LTD.
Eyal Hollander
G01 - MEASURING TESTING